Low-mass secondary-ion ejection from molecular solids by MeV heavy ions: Radial velocity distributions

• Secondary ions sputtered in individual MeV ion impacts are analyzed in a high resolution time-of-flight mass spectrometer. The initial radial velocity distributions of low mass (up to m/z approximate to 300 u) positive and negative secondary ions, sputter

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LARGE ORGANIC-MOLECULES; INDUCED DESORPTION; TRACK STRUCTURE; SPECTROMETRY; FILMS; BIOMOLECULES; BOMBARDMENT; MECHANISMS; IMPULSES; ENERGY

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