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Analysis of liposom...
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Lovric, Jelena,1980Chalmers tekniska högskola,Chalmers University of Technology,Department of Chemical and Biological Engineering; Chalmers University of Technology; SE-412 96 Gothenburg Sweden
(författare)
Analysis of liposome model systems by time-of-flight secondary ion mass spectrometry
- Artikel/kapitelEngelska2014
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LIBRIS-ID:oai:gup.ub.gu.se/210193
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https://gup.ub.gu.se/publication/210193URI
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https://doi.org/10.1002/sia.5623DOI
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https://research.chalmers.se/publication/210193URI
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https://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-484518URI
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Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is an important technique for studying chemical composition of micrometer scale objects because of its high spatial resolution imaging capabilities and chemical specificity. In this work, we focus on the application of ToF-SIMS to gain insight into the chemistry of micrometer size liposomes as a potential model for neurotransmitter vesicles. Two models of giant liposomes were analyzed: histamine and aqueous two-phase system-containing liposomes. Characterization of the internal structure of single fixed liposomes was carried out both with the Bi-3(+) and C-60(+) ion sources. The depth profiling capability of ToF-SIMS was used to investigate the liposome interior.
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Keighron, Jacqueline,1982Chalmers tekniska högskola,Chalmers University of Technology,Department of Chemical and Biological Engineering; Chalmers University of Technology; SE-412 96 Gothenburg Sweden(Swepub:cth)keighron
(författare)
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Angerer, Tina B.,1987Gothenburg University,Göteborgs universitet,Institutionen för kemi och molekylärbiologi,Department of Chemistry and Molecular Biology,University of Gothenburg,Department of Chemistry and Molecular Biology; University of Gothenburg; SE-412 96 Gothenburg Sweden(Swepub:gu)xangti
(författare)
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Li, Xianchan,1982Chalmers tekniska högskola,Chalmers University of Technology,Department of Chemical and Biological Engineering; Chalmers University of Technology; SE-412 96 Gothenburg Sweden(Swepub:cth)xianli
(författare)
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Malmberg, Per,1974Chalmers tekniska högskola,Chalmers University of Technology,Department of Chemical and Biological Engineering; Chalmers University of Technology; SE-412 96 Gothenburg Sweden(Swepub:cth)malmper
(författare)
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Fletcher, John S.Gothenburg University,Göteborgs universitet,Institutionen för kemi och molekylärbiologi,Department of Chemistry and Molecular Biology,University of Gothenburg,Department of Chemistry and Molecular Biology; University of Gothenburg; SE-412 96 Gothenburg Sweden(Swepub:cth)fletcher
(författare)
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Ewing, Andrew G,1957Gothenburg University,Göteborgs universitet,Institutionen för kemi och molekylärbiologi,Department of Chemistry and Molecular Biology,University of Gothenburg,Chalmers tekniska högskola,Chalmers University of Technology,Department of Chemical and Biological Engineering; Chalmers University of Technology; SE-412 96 Gothenburg Sweden;Department of Chemistry and Molecular Biology; University of Gothenburg; SE-412 96 Gothenburg Sweden(Swepub:cth)andrewe
(författare)
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Chalmers tekniska högskolaDepartment of Chemical and Biological Engineering; Chalmers University of Technology; SE-412 96 Gothenburg Sweden
(creator_code:org_t)
Sammanhörande titlar
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Ingår i:Surface and Interface Analysis: 19th International Conference on Secondary Ion Mass Spectrometry (SIMS): Wiley0142-24211096-9918
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Lovric, Jelena, ...
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Keighron, Jacque ...
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Angerer, Tina B. ...
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Li, Xianchan, 19 ...
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Malmberg, Per, 1 ...
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Fletcher, John S ...
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Ewing, Andrew G, ...
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Göteborgs universitet
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