Ion charge-resolved branching in decay of inner shell holes in Xe up to 1200eV

• Using a new multi-electron multi-ion coincidence apparatus and soft x-ray synchrotron radiation we have determined branching ratios to final Xen+ states with 2 < n < 9 from the 4d(-1), 4p(-1), 4s(-1), 3d(-1) and 3p(-1) Xe+ hole states. The coincident electron spectra give information on the Auger cascade pathways. We show that by judicious choice of coincident electrons, almost pure single charge states of the final ions can be selected.

Subject headings

NATURVETENSKAP  -- Fysik -- Atom- och molekylfysik och optik (hsv//swe)

NATURAL SCIENCES  -- Physical Sciences -- Atom and Molecular Physics and Optics (hsv//eng)

NATURVETENSKAP  -- Fysik -- Den kondenserade materiens fysik (hsv//swe)

NATURAL SCIENCES  -- Physical Sciences -- Condensed Matter Physics (hsv//eng)

Keyword

inner shell holes

multiple Auger decay

branching ratios

coincidence detection

MULTIPLE PHOTOIONIZATION

RARE-GASES

COINCIDENCE TECHNIQUE

HIGH-RESOLUTION

IONIZATION

XENON

PHOTOELECTRON

REGION

SPECTROSCOPY

SPECTRA

inner shell holes

Publication and Content Type

ref (subject category)

art (subject category)