Low frequency noise in contacted single-wall carbon nanotube

• Since their discovery, carbon nanotubes present many interesting electrical properties and can be candidates for future shrinking devices. Electrode realization on nanotubes remains a challenge. The deposited contacts must present interesting electrical parameters: low contact resistance, low series resistance, low parasitic capacity and low excess noise. The understanding of conduction phenomena induced into or near the metal/nanotube contact is necessary to improve the device. In this paper we present characterization of a Au-Ti deposited contact on a single-wall carbon nanotube. Steady-state current-voltage measurements, impedance and noise measurements lead to the frequency device characteristic. From this study a low frequency noise electrical model is presented. Using this model and the low frequency noise measurements, we show that the measured thermal noise has its origin in the electrode/nanotube contacts.

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NATURVETENSKAP  -- Fysik (hsv//swe)

NATURAL SCIENCES  -- Physical Sciences (hsv//eng)

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