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Hard X-ray Detectio...
Hard X-ray Detection Using a Single nm Diameter Nanowire
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- Wallentin, Jesper (författare)
- University of Göttingen
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- Osterhoff, Markus (författare)
- University of Göttingen
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- Wilke, Robin N. (författare)
- University of Göttingen
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- Persson, Karl-Magnus (författare)
- Lund University,Lunds universitet,Institutionen för elektro- och informationsteknik,Institutioner vid LTH,Lunds Tekniska Högskola,Department of Electrical and Information Technology,Departments at LTH,Faculty of Engineering, LTH
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- Wernersson, Lars-Erik (författare)
- Lund University,Lunds universitet,Institutionen för elektro- och informationsteknik,Institutioner vid LTH,Lunds Tekniska Högskola,Department of Electrical and Information Technology,Departments at LTH,Faculty of Engineering, LTH
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- Sprung, Michael (författare)
- German Electron Synchrotron (DESY)
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- Salditt, Tim (författare)
- University of Göttingen
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(creator_code:org_t)
- 2014-12-01
- 2014
- Engelska.
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Ingår i: Nano Letters. - : American Chemical Society (ACS). - 1530-6992 .- 1530-6984. ; 14:12, s. 7071-7076
- Relaterad länk:
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http://dx.doi.org/10...
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https://doi.org/10.1...
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https://lup.lub.lu.s...
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https://doi.org/10.1...
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Abstract
Ämnesord
Stäng
- Submicron sized sensors could allow higher resolution in X-ray imaging and diffraction measurements, which are ubiquitous for materials science and medicine. We present electrical measurements of a single 100 nm diameter InP nanowire transistor exposed to hard X-rays. The X-ray induced conductance is over 5 orders of magnitude larger than expected from reported data for X-ray absorption and carrier lifetimes. Time-resolved measurements show very long characteristic lifetimes on the order of seconds, tentatively attributed to long-lived traps, which give a strong amplification effect. As a proof of concept, we use the nanowire to directly image an X-ray nanofocus with submicron resolution.
Ämnesord
- TEKNIK OCH TEKNOLOGIER -- Nanoteknik -- Nanoteknik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Nano-technology -- Nano-technology (hsv//eng)
Nyckelord
- Nanowires
- X-rays
- detector
- III-V
Publikations- och innehållstyp
- art (ämneskategori)
- ref (ämneskategori)
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