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Time-of-flight phot...
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Schönhense, G.Johannes-Gutenberg University Mainz
(author)
Time-of-flight photoelectron momentum microscopy with 80-500 MHz photon sources : Electron-optical pulse picker or bandpass pre-filter
- Article/chapterEnglish2021
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LIBRIS-ID:oai:lup.lub.lu.se:1f2a8fc0-3654-435c-a47e-6f8a73f9d52d
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https://lup.lub.lu.se/record/1f2a8fc0-3654-435c-a47e-6f8a73f9d52dURI
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https://doi.org/10.1107/S1600577521010511DOI
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Language:English
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Summary in:English
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Subject category:art swepub-publicationtype
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Subject category:ref swepub-contenttype
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The small time gaps of synchrotron radiation in conventional multi-bunch mode (100-500 MHz) or laser-based sources with high pulse rate (∼80 MHz) are prohibitive for time-of-flight (ToF) based photoelectron spectroscopy. Detectors with time resolution in the 100 ps range yield only 20-100 resolved time slices within the small time gap. Here we present two techniques of implementing efficient ToF recording at sources with high repetition rate. A fast electron-optical beam blanking unit with GHz bandwidth, integrated in a photoelectron momentum microscope, allows electron-optical 'pulse-picking' with any desired repetition period. Aberration-free momentum distributions have been recorded at reduced pulse periods of 5 MHz (at MAX II) and 1.25 MHz (at BESSY II). The approach is compared with two alternative solutions: A bandpass pre-filter (here a hemispherical analyzer) or a parasitic four-bunch island-orbit pulse train, coexisting with the multi-bunch pattern on the main orbit. Chopping in the time domain or bandpass pre-selection in the energy domain can both enable efficient ToF spectroscopy and photoelectron momentum microscopy at 100-500 MHz synchrotrons, highly repetitive lasers or cavity-enhanced high-harmonic sources. The high photon flux of a UV-laser (80 MHz, <1 meV bandwidth) facilitates momentum microscopy with an energy resolution of 4.2 meV and an analyzed region-of-interest (ROI) down to <800 nm. In this novel approach to 'sub-μm-ARPES' the ROI is defined by a small field aperture in an intermediate Gaussian image, regardless of the size of the photon spot.
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Medjanik, K.Johannes-Gutenberg University Mainz(Swepub:lu)maxl-kma
(author)
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Fedchenko, O.Johannes-Gutenberg University Mainz
(author)
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Zymakova, A.Johannes-Gutenberg University Mainz
(author)
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Chernov, S.Johannes-Gutenberg University Mainz
(author)
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Kutnyakhov, D.Johannes-Gutenberg University Mainz
(author)
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Vasilyev, D.Johannes-Gutenberg University Mainz
(author)
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Babenkov, S.Johannes-Gutenberg University Mainz
(author)
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Elmers, H. J.Johannes-Gutenberg University Mainz
(author)
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Baumgärtel, P.Helmholtz Association of German Research Centers
(author)
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Goslawski, P.Helmholtz Association of German Research Centers
(author)
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Öhrwall, G.Lund University,Lunds universitet,MAX IV-laboratoriet,MAX IV Laboratory(Swepub:lu)maxl-goh
(author)
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Grunske, T.APE GmbH
(author)
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Kauerhof, T.APE GmbH
(author)
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Von Volkmann, K.APE GmbH
(author)
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Kallmayer, M.Surface Concept GmbH
(author)
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Ellguth, M.Surface Concept GmbH
(author)
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Oelsner, A.Surface Concept GmbH
(author)
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Johannes-Gutenberg University MainzHelmholtz Association of German Research Centers
(creator_code:org_t)
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In:Journal of Synchrotron Radiation28, s. 1891-19080909-0495
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Schönhense, G.
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Medjanik, K.
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Fedchenko, O.
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Zymakova, A.
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Chernov, S.
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Kutnyakhov, D.
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Vasilyev, D.
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Babenkov, S.
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Elmers, H. J.
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Baumgärtel, P.
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Goslawski, P.
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Öhrwall, G.
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Grunske, T.
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Kauerhof, T.
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Von Volkmann, K.
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Kallmayer, M.
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Ellguth, M.
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Oelsner, A.
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Lund University