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The Effect of Direc...
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Nguyen, Ky V.University of New South Wales
(författare)
The Effect of Direct Electron Beam Patterning on the Water Uptake and Ionic Conductivity of Nafion Thin Films
- Artikel/kapitelEngelska2023
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Nummerbeteckningar
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LIBRIS-ID:oai:lup.lub.lu.se:28eff628-5631-4c7c-b1ea-091f5da35ecb
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https://lup.lub.lu.se/record/28eff628-5631-4c7c-b1ea-091f5da35ecbURI
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https://doi.org/10.1002/aelm.202300199DOI
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Språk:engelska
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Sammanfattning på:engelska
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Ämneskategori:art swepub-publicationtype
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Ämneskategori:ref swepub-contenttype
Anmärkningar
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The effect of electron-beam patterning on the water uptake and ionic conductivity of Nafion films using a combination of X-ray photoelectron spectroscopy, quartz crystal microbalance studies, neutron reflectometry, and impedance spectroscopy is reported. The aim is to further characterize the nanoscale patterned Nafion structures recently used as a key element in novel ion-to-electron transducers by Gluschke et al. To enable this, the electron beam patterning process is developed for large areas, achieving patterning speeds approaching 1 cm2 h−1, and patterned areas as large as 7 cm2 for the neutron reflectometry studies. It is ultimately shown that electron-beam patterning affects both the water uptake and the ionic conductivity, depending on film thickness. Type-II adsorption isotherm behavior is seen for all films. For thick films (≈230 nm), a strong reduction in water uptake with electron-beam patterning is found. In contrast, for thin films (≈30 nm), electron-beam patterning enhances water uptake. Notably, for either thickness, the reduction in ionic conductivity arising from electron-beam patterning is kept to less than an order of magnitude. Mechanisms are proposed for the observed behavior based on the known complex morphology of Nafion films to motivate future studies of electron-beam processed Nafion.
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Biuppslag (personer, institutioner, konferenser, titlar ...)
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Gluschke, Jan G.University of New South Wales(Swepub:lu)ftf-jgu
(författare)
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Mostert, A. BernardusSwansea University
(författare)
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Nelson, AndrewAustralian Nuclear Science and Technology Organisation
(författare)
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Burwell, GregorySwansea University
(författare)
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Lyttleton, Roman W.Lund University,Lunds universitet,NanoLund: Centre for Nanoscience,Annan verksamhet, LTH,Lunds Tekniska Högskola,Fasta tillståndets fysik,Fysiska institutionen,Institutioner vid LTH,LU profilområde: Ljus och material,Lunds universitets profilområden,Other operations, LTH,Faculty of Engineering, LTH,Solid State Physics,Department of Physics,Departments at LTH,Faculty of Engineering, LTH,LU Profile Area: Light and Materials,Lund University Profile areas(Swepub:lu)ro2241ly
(författare)
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Cavaye, HamishISIS Neutron and Muon Source
(författare)
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Welbourn, Rebecca J.L.ISIS Neutron and Muon Source
(författare)
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Seidl, JakobUniversity of New South Wales
(författare)
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Lagier, MaximeUniversity of New South Wales
(författare)
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Miranda, Marta SanchezUniversity of New South Wales
(författare)
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McGettrick, James D.Swansea University
(författare)
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Watson, TrystanSwansea University
(författare)
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Meredith, PaulSwansea University,University of Queensland
(författare)
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Micolich, Adam P.University of New South Wales
(författare)
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University of New South WalesSwansea University
(creator_code:org_t)
Sammanhörande titlar
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Ingår i:Advanced Electronic Materials9:82199-160X
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Till lärosätets databas
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Nguyen, Ky V.
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Gluschke, Jan G.
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Mostert, A. Bern ...
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Nelson, Andrew
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Burwell, Gregory
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Lyttleton, Roman ...
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visa fler...
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Cavaye, Hamish
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Welbourn, Rebecc ...
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Seidl, Jakob
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Lagier, Maxime
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Miranda, Marta S ...
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McGettrick, Jame ...
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Watson, Trystan
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Meredith, Paul
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Micolich, Adam P ...
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visa färre...
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