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Current-voltage cor...
Current-voltage correlations in interferometers
- Article/chapterEnglish2007
Publisher, publication year, extent ...
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2007-05-09
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IOP Publishing,2007
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LIBRIS-ID:oai:lup.lub.lu.se:36d92e8f-cea1-4b48-8a5f-8e091f1aad90
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https://lup.lub.lu.se/record/662962URI
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https://doi.org/10.1088/1367-2630/9/5/117DOI
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Language:English
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Summary in:English
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Subject category:art swepub-publicationtype
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Subject category:ref swepub-contenttype
Notes
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We investigate correlations of current at contacts and voltage fluctuations at voltage probes coupled to interferometers. The results are compared with correlations of current and occupation number fluctuations at dephasing probes. We use a quantum Langevin approach for the average quantities and their fluctuations. For higher order correlations we develop a stochastic path integral approach and find the generating functions of voltage or occupation number fluctuations. We also derive a generating function for the joint distribution of voltage or occupation number at the probe and current fluctuations at a terminal of a conductor. For energy independent scattering we found earlier that the generating function of current cumulants in interferometers with a one-channel dephasing or voltage probe are identical. Nevertheless, the distribution function for voltage and the distribution function for occupation number fluctuations differ, the latter being broader than that of the former in all examples considered here.
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Samuelsson, PeterLund University,Lunds universitet,Matematisk fysik,Fysiska institutionen,Institutioner vid LTH,Lunds Tekniska Högskola,Mathematical Physics,Department of Physics,Departments at LTH,Faculty of Engineering, LTH(Swepub:lu)teor-psa
(author)
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Buettiker, Markus
(author)
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Matematisk fysikFysiska institutionen
(creator_code:org_t)
Related titles
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In:New Journal of Physics: IOP Publishing91367-2630
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