DT Modeling of Clock Phase Noise Effects in LP CT Delta-Sigma ADCs with RZ Feedback

• The performance of continuous-time (CT) Delta Sigma modulators is limited by their sensitivity to clock phase noise (PN). The clock PN-induced in-band noise (IBN) is dependent on the magnitude and frequency of both the desired in-band signals and the out-of-band signals, as well as the shape of the clock PN spectrum. This brief presents a discrete-time (DT) model of the dominant clock PN-induced errors. It enables fast and accurate simulations of the clock PN effects with arbitrary input signals, PN spectra, and noise-transfer functions. The model has been verified by CT simulations and measurements on a second-order low-pass CT Delta Sigma modulator with return-to-zero feedback. The flexibility and usefulness of the DT model are demonstrated, and the two dominant clock PN effects are compared by means of simulations with orthogonal frequency-division multiplexing input signals and various PN specifications.

Ämnesord

TEKNIK OCH TEKNOLOGIER  -- Elektroteknik och elektronik (hsv//swe)

ENGINEERING AND TECHNOLOGY  -- Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)

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