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Photoemission study of the valence band offset between low temperature GaAs and (GaMn)As

Adell, M. (author)
Chalmers University of Technology,Lund University,Lunds universitet,MAX IV-laboratoriet,MAX IV Laboratory
Adell, J. (author)
Chalmers University of Technology,Lund University,Lunds universitet,MAX IV-laboratoriet,MAX IV Laboratory
Ilver, L. (author)
Chalmers University of Technology
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Kanski, J. (author)
Chalmers University of Technology
Sadowski, J. (author)
Lund University,Lunds universitet,MAX IV-laboratoriet,MAX IV Laboratory,Institute - Center for Molecular and Macromolecular Studies of the Polish Academy of Sciences
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 (creator_code:org_t)
AIP Publishing, 2006
2006
English.
In: Applied Physics Letters. - : AIP Publishing. - 0003-6951 .- 1077-3118. ; 89:17
  • Journal article (peer-reviewed)
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  • Using synchrotron based photoelectron spectroscopy (GaMn) AsGaAs interfaces prepared in situ by low temperature molecular beam epitaxy have been studied. No band offset between the two systems is observed. The continuous transition is explained as an effect of dilution of the (GaMn)As by GaAs adlayers.

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Adell, M.
Adell, J.
Ilver, L.
Kanski, J.
Sadowski, J.
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Applied Physics ...
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Lund University

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