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  • Haugen, O.Universitetet i Oslo,University of Oslo (author)

High resolution thermal imaging of hotspots in superconducting films

  • Article/chapterEnglish2007

Publisher, publication year, extent ...

  • Institute of Electrical and Electronics Engineers (IEEE),2007

Numbers

  • LIBRIS-ID:oai:research.chalmers.se:065f758a-d99d-4845-b8f2-b4748c387253
  • https://doi.org/10.1109/TASC.2007.899341DOI
  • https://research.chalmers.se/publication/82377URI
  • https://doi.org/10.1109/tasc.2007.899341DOI

Supplementary language notes

  • Language:English
  • Summary in:English

Part of subdatabase

Classification

  • Subject category:art swepub-publicationtype
  • Subject category:ref swepub-contenttype

Notes

  • Thermal imaging of hotspots in bridge structures of YbaCuO thin films is presented with micrometer resolution. Hotspots formed by passing transport currents are observed using a method based on the temperature dependence in the photoluminescence of a polymer thin film deposited on the superconductor. The hotspots are self maintained and have hysteretic behavior. An external magnetic field changes their behavior. The temperature distribution over the bridge and in its vicinity can be observed with a resolution better than 0.1 K. Also details of the experimental method will be reported.

Subject headings and genre

Added entries (persons, corporate bodies, meetings, titles ...)

  • Johansen, T. H.Universitetet i Oslo,University of Oslo (author)
  • Chen, H.Universitetet i Oslo,University of Oslo (author)
  • Yurchenko, V.Universitetet i Oslo,University of Oslo (author)
  • Vase, P. (author)
  • Winkler, Dag,1957Chalmers tekniska högskola,Chalmers University of Technology(Swepub:cth)winkler1 (author)
  • Davidson, B. A. (author)
  • Testa, Gabriel (author)
  • Sarnelli, E. (author)
  • Altshuler, E.Universidad de La Habana,University of Havana (author)
  • Universitetet i OsloChalmers tekniska högskola (creator_code:org_t)

Related titles

  • In:IEEE Transactions on Applied Superconductivity: Institute of Electrical and Electronics Engineers (IEEE)17:2/3, s. 3215-32181558-25151051-8223

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