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Open resonator tech...
Open resonator technique for measuring multilayered dielectric plates
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- Deleniv, Anatoli, 1969 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Gevorgian, Spartak, 1948 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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(creator_code:org_t)
- 2005
- 2005
- English.
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In: IEEE Transactions on Microwave Theory and Techniques. - 0018-9480 .- 1557-9670. ; 53:9, s. 2908-2916
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Abstract
Subject headings
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- A generalized formulation of an open resonator technique including multilayer dielectric plates is proposed. It is used for experimental characterization of the permittivity and loss tangent of one of the layers. An experimental measurement system is developed and used to measure the dielectric properties of high-permittivity ferroelectric films, which demonstrates the utility of the approach. The loss tangent of the layer studied is obtained with the analytical formula derived, which speeds the data processing procedure. It is experimentally shown that the air gap between the sample and the plate mirror may significantly reduce the accuracy of the open resonator technique. It is also shown that the formulation developed here provides the means to deal with the problems associated with the air gap.
Subject headings
- TEKNIK OCH TEKNOLOGIER -- Elektroteknik och elektronik -- Annan elektroteknik och elektronik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Electrical Engineering, Electronic Engineering, Information Engineering -- Other Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)
Keyword
- permittivity measurements
- ferroelectric thick films
Publication and Content Type
- art (subject category)
- ref (subject category)
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