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Embedded Fin-Like M...
Embedded Fin-Like Metal/CNT Hybrid Structures for Flexible and Transparent Conductors
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- Jiang, Di, 1983 (författare)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Wang, Nan, 1988 (författare)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Edwards, Michael, 1986 (författare)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Mu, Wei, 1985 (författare)
- Chalmers tekniska högskola,Chalmers University of Technology
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- NYLANDER, ANDREAS, 1988 (författare)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Fu, Yifeng, 1984 (författare)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Jeppson, Kjell, 1947 (författare)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Liu, Johan, 1960 (författare)
- Chalmers tekniska högskola,Chalmers University of Technology
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(creator_code:org_t)
- 2016-01-14
- 2016
- Engelska.
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Ingår i: Small. - : Wiley. - 1613-6810 .- 1613-6829. ; 12:11, s. 1521-1526
- Relaterad länk:
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http://dx.doi.org/10...
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https://doi.org/10.1...
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https://research.cha...
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Abstract
Ämnesord
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- In this paper, an embedded fin-like metal-coated carbon nanotube (Fin-M/CNT) structure is demonstrated for flexible and transparent conductor wire applications. Embedded in a polydimethylsiloxane polymeric substrate, Fin-M/CNT wires with a minimum width of 5 μm and a minimum pitch of 10 μm have been achieved. Direct current resistances of single Fin-M/CNT wires, where the supporting CNT structures have been covered by Ti/Al/Au metal coatings of different thicknesses, have been measured. The high aspect ratio of the fin-like structures not only improves the adhesion between the wires and the polymeric substrate, but also yields a low resistance at a small surface footprint. In addition, transparent Fin-M/CNT grid lines with hexagonal patterns, with a sheet resistance of as low as 45 Ω sq−1, have been achieved at an optical transmittance of 88%. The robustness of the Fin-M/CNT structures has been demonstrated in bending tests up to 500 cycles and no significant changes in wire resistances are observed.
Ämnesord
- TEKNIK OCH TEKNOLOGIER -- Nanoteknik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Nano-technology (hsv//eng)
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Jiang, Di, 1983
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Wang, Nan, 1988
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Edwards, Michael ...
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Mu, Wei, 1985
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NYLANDER, ANDREA ...
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Fu, Yifeng, 1984
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visa fler...
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Jeppson, Kjell, ...
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Liu, Johan, 1960
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- TEKNIK OCH TEKNOLOGIER
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TEKNIK OCH TEKNO ...
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Chalmers tekniska högskola