SwePub
Sök i LIBRIS databas

  Extended search

id:"swepub:oai:research.chalmers.se:30f35cf4-d1e6-407d-b489-7e8a33f28ac5"
 

Search: id:"swepub:oai:research.chalmers.se:30f35cf4-d1e6-407d-b489-7e8a33f28ac5" > Bit error probabili...

  • 1 of 1
  • Previous record
  • Next record
  •    To hitlist
  • Lassing, Johan,1973Chalmers tekniska högskola,Chalmers University of Technology (author)

Bit error probability of coherent M-ary PSK over flat Rayleigh fading channels

  • BookEnglish2005

Publisher, publication year, extent ...

  • Institution of Engineering and Technology (IET),2005
  • electronicrdacarrier

Numbers

  • LIBRIS-ID:oai:research.chalmers.se:30f35cf4-d1e6-407d-b489-7e8a33f28ac5
  • https://research.chalmers.se/publication/23010URI
  • https://doi.org/10.1049/el:20052348DOI
  • https://research.chalmers.se/publication/12002URI

Supplementary language notes

  • Language:English

Part of subdatabase

Classification

  • Subject category:rap swepub-publicationtype
  • Subject category:vet swepub-contenttype

Subject headings and genre

Added entries (persons, corporate bodies, meetings, titles ...)

  • Agrell, Erik,1965Chalmers tekniska högskola,Chalmers University of Technology(Swepub:cth)agrell (author)
  • Ström, Erik,1965Chalmers tekniska högskola,Chalmers University of Technology(Swepub:cth)estrom (author)
  • Ottosson Gadd, Tony,1969Chalmers tekniska högskola,Chalmers University of Technology(Swepub:cth)tonyo (author)
  • Chalmers tekniska högskola (creator_code:org_t)

Related titles

  • In:IEE Electronic Letters: Institution of Engineering and Technology (IET)41:21, s. 1186-11870013-5194

Internet link

Find in a library

To the university's database

  • 1 of 1
  • Previous record
  • Next record
  •    To hitlist

Search outside SwePub

Kungliga biblioteket hanterar dina personuppgifter i enlighet med EU:s dataskyddsförordning (2018), GDPR. Läs mer om hur det funkar här.
Så här hanterar KB dina uppgifter vid användning av denna tjänst.

 
pil uppåt Close

Copy and save the link in order to return to this view