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Effect of different temperature cycle profiles on the crack propagation and microstructural evolution of lead free solder joints of different electronic components

Andersson, Cristina, 1969 (author)
Chalmers tekniska högskola,Chalmers University of Technology
Andersson, Dag R. (author)
Tegehall, Per-Erik (author)
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Liu, Johan, 1960 (author)
Chalmers tekniska högskola,Chalmers University of Technology
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 (creator_code:org_t)
2004
2004
English.
In: Proceedings of the 5th international conference on thermal, mechanical and thermo-mechanical simulation and experiments in micro-electronics and micro-systems (EuroSimE). ; May:10th to 12th, s. pp 455-464
  • Conference paper (peer-reviewed)
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TEKNIK OCH TEKNOLOGIER  -- Elektroteknik och elektronik (hsv//swe)
ENGINEERING AND TECHNOLOGY  -- Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)

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Andersson, Crist ...
Andersson, Dag R ...
Tegehall, Per-Er ...
Liu, Johan, 1960
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ENGINEERING AND TECHNOLOGY
ENGINEERING AND ...
and Electrical Engin ...
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Chalmers University of Technology

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