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High-Temperature Charge-Stripe Correlations in La1.675Eu0.2Sr0.125CuO4

Wang, Qisi (author)
Universität Zürich,University of Zürich,Univ Zurich, Phys Inst, Winterthurerstr 190, Zurich 8057, Switzerland.
Horio, M. (author)
Universität Zürich,University of Zürich,Univ Zurich, Phys Inst, Winterthurerstr 190, Zurich 8057, Switzerland.,Ecole Polytech Federate Lausanne EPFL, Inst Phys, CH-1015 Lausanne, Switzerland.
von Arx, K. (author)
Universität Zürich,University of Zürich,Univ Zurich, Phys Inst, Winterthurerstr 190, Zurich 8057, Switzerland.,European Synchrotron Radiat Facil, 71 Ave Martyrs, Grenoble 38043, France.
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Shen, Y. (author)
Fudan University,Fudan Univ, State Key Lab Surface Phys, Shanghai 200433, Peoples R China.;Fudan Univ, Dept Phys, Shanghai 200433, Peoples R China.
Mukkattukavil, Deepak John (author)
Uppsala universitet,Molekyl- och kondenserade materiens fysik
Sassa, Yasmine, 1981 (author)
Chalmers tekniska högskola,Chalmers University of Technology,Chalmers Univ Technol, Dept Phys, SE-41296 Gothenburg, Sweden.
Ivashko, O. (author)
Universität Zürich,University of Zürich,Univ Zurich, Phys Inst, Winterthurerstr 190, Zurich 8057, Switzerland.
Matt, C. E. (author)
Paul Scherrer Institut,Universität Zürich,University of Zürich,Univ Zurich, Phys Inst, Winterthurerstr 190, Zurich 8057, Switzerland.;Paul Scherrer Inst, Photon Sci Div, Swiss Light Source, CH-5232 Villigen, Switzerland.
Pyon, S. (author)
University of Tokyo, Japan,Univ Tokyo, Dept Adv Mat, Kashiwa, Chiba 2778561, Japan.
Takayama, T. (author)
University of Tokyo, Japan,Univ Tokyo, Dept Adv Mat, Kashiwa, Chiba 2778561, Japan.,Hokkaido Univ, Dept Phys, Sapporo, Hokkaido 0600810, Japan.,Sophia Univ, Dept Engn & Appl Sci, Tokyo 1028554, Japan.,Paul Scherrer Inst, Photon Sci Div, Swiss Light Source, CH-5232 Villigen, Switzerland.
Takagi, H. (author)
University of Tokyo, Japan,Univ Tokyo, Dept Adv Mat, Kashiwa, Chiba 2778561, Japan.
Kurosawa, T. (author)
Hokkaido University
Momono, N. (author)
Muroran Institute of Technology,Hokkaido University,Hokkaido Univ, Dept Phys, Sapporo, Hokkaido 0600810, Japan.;Muroran Inst Technol, Dept Appl Sci, Muroran, Hokkaido 0508585, Japan.
Oda, M. (author)
Hokkaido University,Hokkaido Univ, Dept Phys, Sapporo, Hokkaido 0600810, Japan.
Adachi, T. (author)
Sophia University
Haidar, S. M. (author)
Tohoku University,Tohoku Univ, Dept Appl Phys, Sendai, Miyagi 9808579, Japan.
Koike, Y. (author)
Tohoku University,Tohoku Univ, Dept Appl Phys, Sendai, Miyagi 9808579, Japan.
Tseng, Y. (author)
Paul Scherrer Institut,Paul Scherrer Inst, Photon Sci Div, Swiss Light Source, CH-5232 Villigen, Switzerland.
Zhang, W. (author)
Paul Scherrer Institut,Paul Scherrer Inst, Photon Sci Div, Swiss Light Source, CH-5232 Villigen, Switzerland.
Zhao, J. (author)
Fudan University,Fudan Univ, State Key Lab Surface Phys, Shanghai 200433, Peoples R China.;Fudan Univ, Dept Phys, Shanghai 200433, Peoples R China.;Collaborat Innovat Ctr Adv Microstruct, Nanjing 210093, Peoples R China.
Kummer, K. (author)
European Synchrotron Radiation Facility (ESRF)
Garcia-Fernandez, M. (author)
Diamond Light Source,Diamond Light Source, Harwell Campus, Didcot OX11 0DE, Oxon, England.
Zhou, Ke-Jin (author)
Diamond Light Source,Diamond Light Source, Harwell Campus, Didcot OX11 0DE, Oxon, England.
Christensen, N. B. (author)
Danmarks Tekniske Universitet,Technical University of Denmark,Tech Univ Denmark, Dept Phys, DK-2800 Lyngby, Denmark.
Ronnow, H. M. (author)
Ecole Polytechnique Federale de Lausanne (EPFL),Swiss Federal Institute of Technology in Lausanne (EPFL)
Schmitt, T. (author)
Paul Scherrer Institut
Chang, J. (author)
Universität Zürich,University of Zürich,Univ Zurich, Phys Inst, Winterthurerstr 190, Zurich 8057, Switzerland.
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Universität Zürich Univ Zurich, Phys Inst, Winterthurerstr 190, Zurich 8057, Switzerland (creator_code:org_t)
AMER PHYSICAL SOC, 2020
2020
English.
In: Physical Review Letters. - : AMER PHYSICAL SOC. - 1079-7114 .- 0031-9007. ; 124:18
  • Journal article (peer-reviewed)
Abstract Subject headings
Close  
  • We use resonant inelastic x-ray scattering to investigate charge-stripe correlations in La1.675Eu0.2Sr0.125CuO4. By differentiating elastic from inelastic scattering, it is demonstrated that charge-stripe correlations precede both the structural low-temperature tetragonal phase and the transport-defined pseudogap onset. The scattering peak amplitude from charge stripes decays approximately as T-2 towards our detection limit. The in-plane integrated intensity, however, remains roughly temperature independent. Therefore, although the incommensurability shows a remarkably large increase at high temperature, our results are interpreted via a single scattering constituent. In fact, direct comparison to other stripe-ordered compounds (La1.875Ba0.125CuO4, La1.475Nd0.4Sr0.125CuO4, and La1.875Sr0.125CuO4) suggests a roughly constant integrated scattering intensity across all these compounds. Our results therefore provide a unifying picture for the charge-stripe ordering in La-based cuprates. As charge correlations in La1.675Eu0.2Sr0.125CuO4 extend beyond the low-temperature tetragonal and pseudogap phase, their emergence heralds a spontaneous symmetry breaking in this compound.

Subject headings

NATURVETENSKAP  -- Kemi -- Fysikalisk kemi (hsv//swe)
NATURAL SCIENCES  -- Chemical Sciences -- Physical Chemistry (hsv//eng)
NATURVETENSKAP  -- Fysik -- Atom- och molekylfysik och optik (hsv//swe)
NATURAL SCIENCES  -- Physical Sciences -- Atom and Molecular Physics and Optics (hsv//eng)
NATURVETENSKAP  -- Fysik -- Den kondenserade materiens fysik (hsv//swe)
NATURAL SCIENCES  -- Physical Sciences -- Condensed Matter Physics (hsv//eng)

Keyword

Inelastic scattering
X ray scattering
Copper compounds

Publication and Content Type

art (subject category)
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