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- Jeppson, Kjell,1947Chalmers tekniska högskola,Chalmers University of Technology (author)
Hotspot test structures for evaluating carbon nanotube microfin coolers and graphene-like heat spreaders
- Article/chapterEnglish2016
Publisher, publication year, extent ...
- 2016
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- LIBRIS-ID:oai:research.chalmers.se:4dadbf24-99ea-428a-9ee2-a2e8a85b11b0
- https://doi.org/10.1109/ICMTS.2016.7476169DOI
- https://research.chalmers.se/publication/231937URI
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- Language:English
- Summary in:English
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Notes
- The design, fabrication, and use of a hotspot-producing and temperature-sensing test structure for evaluating the thermal properties of carbon nanotubes, graphene and boron nitride for cooling of electronic devices in applications like 3D integrated chip-stacks, power amplifiers and light-emitting diodes is described. The test structure is a simple meander-shaped metal resistor serving both as the hotspot and the temperature thermo-meter. By use of this test structure, the influence of emerging materials like those mentioned above on the temperature of the hotspot has been evaluated with good accuracy).
Subject headings and genre
- TEKNIK OCH TEKNOLOGIER Elektroteknik och elektronik hsv//swe
- ENGINEERING AND TECHNOLOGY Electrical Engineering, Electronic Engineering, Information Engineering hsv//eng
- test structures
- resistance temperature detectors
- hotspots
- graphene
- heat spreaders
- boron nitride
Added entries (persons, corporate bodies, meetings, titles ...)
- Bao, JieChalmers tekniska högskola,Chalmers University of Technology,Shanghai University (author)
- Huang, S.Chalmers tekniska högskola,Chalmers University of Technology,Shanghai University (author)
- Zhang, Yong,1982Chalmers tekniska högskola,Chalmers University of Technology(Swepub:cth)yongz (author)
- Sun, Shuangxi,1986Chalmers tekniska högskola,Chalmers University of Technology(Swepub:cth)shuangxi (author)
- Fu, Yifeng,1984Chalmers tekniska högskola,Chalmers University of Technology(Swepub:cth)yifeng (author)
- Liu, Johan,1960Chalmers tekniska högskola,Chalmers University of Technology(Swepub:cth)jliu (author)
- Chalmers tekniska högskolaShanghai University (creator_code:org_t)
Related titles
- In:29th IEEE International Conference on Microelectronic Test Structures (ICMTS), Yokohama, Japan, Mar 28-31, 20162016-May, s. 32-361071-9032
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