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IGBT Power Stack Integrity Assessment Method for High-Power Magnet Supplies

Asimakopoulos, Panagiotis, 1985 (author)
Organisation européenne pour la recherche nucléaire (CERN),European Organization for Nuclear Research (CERN)
Papastergiou, K. (author)
Organisation européenne pour la recherche nucléaire (CERN),European Organization for Nuclear Research (CERN)
Thiringer, Torbjörn, 1966 (author)
Chalmers tekniska högskola,Chalmers University of Technology
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Bongiorno, Massimo, 1976 (author)
Chalmers tekniska högskola,Chalmers University of Technology
Le Godec, Gilles (author)
Organisation européenne pour la recherche nucléaire (CERN),European Organization for Nuclear Research (CERN)
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 (creator_code:org_t)
2019
2019
English.
In: IEEE Transactions on Power Electronics. - 0885-8993 .- 1941-0107. ; 34:11, s. 11228-11240
  • Journal article (peer-reviewed)
Abstract Subject headings
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  • This paper proposes a method for assessing the integrity of a series of insulated-gate bipolar transistor (IGBT) power stacks during factory-acceptance tests and service stops. The key challenge that is addressed in this paper is detecting common assembly issues that affect the power stack thermal path as well as distinguishing the acute aging effects of bond-wire lift-off and solder delamination. The method combines offline Vce measurements with current in the extended Zero Temperature Coefficient (ZTC) operating region as well as with sensing current without modifications to the power stack. It also employs on-the-stack Vce calibration for both the measurements. Additionally, only a fixed duty cycle pattern is needed to control the switches. The paper also presents a sensitivity analysis of the method to various parameters such as the current level in the extended ZTC operating region, the precision of the Vce measurement, as well as the ambient, the cooling-water, and the junction temperatures. The experimental results are obtained from a high-current IGBT power stack used in a magnet power supply for particle accelerators and are compared favorably to results from finite element method and lumped parameter network simulations confirming the applicability of the method.

Subject headings

TEKNIK OCH TEKNOLOGIER  -- Maskinteknik -- Energiteknik (hsv//swe)
ENGINEERING AND TECHNOLOGY  -- Mechanical Engineering -- Energy Engineering (hsv//eng)
NATURVETENSKAP  -- Fysik -- Annan fysik (hsv//swe)
NATURAL SCIENCES  -- Physical Sciences -- Other Physics Topics (hsv//eng)
TEKNIK OCH TEKNOLOGIER  -- Elektroteknik och elektronik -- Annan elektroteknik och elektronik (hsv//swe)
ENGINEERING AND TECHNOLOGY  -- Electrical Engineering, Electronic Engineering, Information Engineering -- Other Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)

Keyword

thermal performance
Aging detection
insulatedgate bipolar transistor (IGBT)
particle accelerators
Vce method
condition monitoring

Publication and Content Type

art (subject category)
ref (subject category)

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