Sökning: id:"swepub:oai:research.chalmers.se:4f0a4428-2ae3-4cc4-8cb9-57b2b2d8114b" >
Noise and Aliasing ...
-
Sonerud, Björn,1979Chalmers tekniska högskola,Chalmers University of Technology
(författare)
Noise and Aliasing Aspects in a Multiharmonic-Dielectric-Response-Measurement System
- Artikel/kapitelEngelska2011
Förlag, utgivningsår, omfång ...
Nummerbeteckningar
-
LIBRIS-ID:oai:research.chalmers.se:4f0a4428-2ae3-4cc4-8cb9-57b2b2d8114b
-
https://doi.org/10.1109/TIM.2011.2147570DOI
-
https://research.chalmers.se/publication/148367URI
Kompletterande språkuppgifter
-
Språk:engelska
-
Sammanfattning på:engelska
Ingår i deldatabas
Klassifikation
-
Ämneskategori:kon swepub-publicationtype
-
Ämneskategori:ref swepub-contenttype
Anmärkningar
-
Dielectric-response measurements are commonly performed with frequency-domain spectroscopy, polarization/depolarization-current measurements, or return-voltage measurements. These techniques operate in a frequency or time domain, and all have high requirements on the voltage source in order to acquire accurate results. This limits dielectric-response measurements to offline applications. A new technique, which is called arbitrary-waveform- impedance spectroscopy, has been developed, which makes use of the harmonics of any voltage waveform to perform dielectric-response measurements. The technique provides possibilities for online measurements facilitating the monitoring of materials and components in high-voltage applications. Here, the different aspects of the measurement system are presented, including circuit modeling, normalization, and discussions on aliasing and noise; all of them are necessary to control in order to perform accurate measurements. © 2011 IEEE.
Ämnesord och genrebeteckningar
Biuppslag (personer, institutioner, konferenser, titlar ...)
-
Bengtsson, Tord,1954ABB(Swepub:cth)tordb
(författare)
-
Blennow, Jörgen,1966Chalmers tekniska högskola,Chalmers University of Technology(Swepub:cth)blennow
(författare)
-
Gubanski, Stanislaw,1950Chalmers tekniska högskola,Chalmers University of Technology(Swepub:cth)staszek
(författare)
-
Chalmers tekniska högskolaABB
(creator_code:org_t)
Sammanhörande titlar
-
Ingår i:IEEE Transactions on Instrumentation and Measurement60:13, s. 3875-38821557-96620018-9456
Internetlänk
Hitta via bibliotek
Till lärosätets databas