Scattering Analysis of Thick Wires with the MoM using Macro Basis Functions

Du Plessis, Jacques T.Universiteit Stellenbosch,Stellenbosch University (författare)

This work is concerned with the analysis of scattering by conducting wires connected to conducting structures, using the method of moments (MoM). Based on thin-wire assumptions, low numbers of degrees of freedom (DoFs) are required by typical exact-kernel thin-wire MoM solvers, for accurate analysis. However, the thin-wire assumptions break down when the wire diameter becomes appreciably large in terms of the wavelength. An approach based on macro basis functions (MBFs) for wire current representation is outlined, aimed at extending the wire thickness range of accurate analysis, while maintaining a low number of DoFs similar to that of thin-wire formulations. Preliminary results demonstrate the effectiveness of the MBF approach.

Dommisse, William R.Universiteit Stellenbosch,Stellenbosch University (författare)
Botha, Matthys MUniversiteit Stellenbosch,Stellenbosch University (författare)
Rylander, Thomas,1972Chalmers tekniska högskola,Chalmers University of Technology(Swepub:cth)rylander (författare)
Universiteit StellenboschChalmers tekniska högskola (creator_code:org_t)

Ingår i:2022 International Conference on Electromagnetics in Advanced Applications, ICEAA 2022, s. 340-342

Av författaren/redakt...: Du Plessis, Jacq ...; Dommisse, Willia ...; Botha, Matthys M; Rylander, Thomas ...

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