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Independent determi...
Independent determination of In and N concentrations in GaInNAs alloys
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- Lu, W (author)
- University Of Nottingham
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- Lim, Jun (author)
- University Of Nottingham
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- Bull, S. (author)
- University Of Nottingham
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- Andrianov, A.V. (author)
- University Of Nottingham
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- Staddon, C. (author)
- University Of Nottingham
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- Foxon, Tom (author)
- University Of Nottingham
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- Sadeghi, Mahdad, 1964 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Wang, Shu Min, 1963 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Larsson, Anders, 1957 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Larkins, Eric (author)
- University Of Nottingham
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(creator_code:org_t)
- 2009-09-18
- 2009
- English.
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In: Semiconductor Science and Technology. - : IOP Publishing. - 1361-6641 .- 0268-1242. ; 24:10, s. 105016-
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Abstract
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- High-resolution x-ray diffraction (HRXRD) and photoreflectance ( PR) spectroscopy were used to independently determine the In and N concentrations in GaInNAs alloys grown by solid-source molecular beam epitaxy (SSMBE). The lattice constant and bandgap energy can be expressed as two independent equations in terms of the In and N concentrations, respectively. The HRXRD measurement provided the lattice constant and the PR measurement extracted the bandgap energy. By simultaneously solving these two equations, we have determined the In and N concentrations with the error as small as 0.001.
Subject headings
- TEKNIK OCH TEKNOLOGIER -- Elektroteknik och elektronik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)
Publication and Content Type
- art (subject category)
- ref (subject category)
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- By the author/editor
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Lu, W
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Lim, Jun
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Bull, S.
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Andrianov, A.V.
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Staddon, C.
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Foxon, Tom
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show more...
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Sadeghi, Mahdad, ...
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Wang, Shu Min, 1 ...
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Larsson, Anders, ...
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Larkins, Eric
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show less...
- About the subject
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- ENGINEERING AND TECHNOLOGY
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ENGINEERING AND ...
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and Electrical Engin ...
- Articles in the publication
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Semiconductor Sc ...
- By the university
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Chalmers University of Technology