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Non-Blocking Testing for Network-on-Chip

Huang, Letian (author)
Wang, Junshi (author)
Ebrahimi, Masoumeh (author)
KTH,Industriell och Medicinsk Elektronik
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Daneshtalab, Masoud (author)
KTH,Elektronik och Inbyggda System
Zhang, Xiaofan (author)
Li, Guangjun (author)
Jantsch, Axel (author)
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 (creator_code:org_t)
IEEE, 2016
2016
English.
In: IEEE Transactions on Computers. - : IEEE. - 0018-9340 .- 1557-9956. ; 65:3, s. 679-692
  • Journal article (peer-reviewed)
Abstract Subject headings
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  • To achieve high reliability in on-chip networks, it is necessary to test the network as frequently as possible to detect physical failures before they lead to system-level failures. A main obstacle is that the circuit under test has to be isolated, resulting in network cuts and packet blockage which limit the testing frequency. To address this issue, we propose a comprehensive network-level approach which could test multiple routers simultaneously at high speed without blocking or dropping packets. We first introduce a reconfigurable router architecture allowing the cores to keep their connections with the network while the routers are under test. A deadlock-free and highly adaptive routing algorithm is proposed to support reconfigurations for testing. In addition, a testing sequence is defined to allow testing multiple routers to avoid dropping of packets. A procedure is proposed to control the behavior of the affected packets during the transition of a router from the normal to the testing mode and vice versa. This approach neither interrupts the execution of applications nor has a significant impact on the execution time. Experiments with the PARSEC benchmarks on an 8x8 NoC-based chip multiprocessors show only 3 percent execution time increase with four routers simultaneously under test.

Subject headings

NATURVETENSKAP  -- Data- och informationsvetenskap -- Datavetenskap (hsv//swe)
NATURAL SCIENCES  -- Computer and Information Sciences -- Computer Sciences (hsv//eng)

Keyword

Reconfigurable router architecture
built-in self-test
on-chip interconnect
single-chip multiprocessors

Publication and Content Type

ref (subject category)
art (subject category)

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