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Search: L773:0277 786X OR L773:1996 756X OR L773:9780819489197 > (2015-2019) > Multi-parameter est...

Multi-parameter estimation of high-Q silicon rich nitride resonators using optical frequency domain reflectometry

Bru, Luis A. (author)
Universitat Politecnica de Valencia (UPV),Polytechnic University of Valencia (UPV)
Ye, Zhichao, 1991 (author)
Chalmers tekniska högskola,Chalmers University of Technology
Pastor, Daniel (author)
Universitat Politecnica de Valencia (UPV),Polytechnic University of Valencia (UPV)
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Muñoz, Pascual (author)
Universitat Politecnica de Valencia (UPV),Polytechnic University of Valencia (UPV)
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 (creator_code:org_t)
SPIE, 2018
2018
English.
In: Proceedings of SPIE - The International Society for Optical Engineering. - : SPIE. - 0277-786X .- 1996-756X. ; 10535
  • Conference paper (peer-reviewed)
Abstract Subject headings
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  • Many linear and nonlinear optics applications rely on micro-resonators (MRRs) with carefully designed dispersion and coupling rate coefficients. These parameters are however challenging to measure for MRRs based on high-confinement optical waveguides. In this paper, we report on the use of optical frequency domain reflectometry (OFDR) for the measurement of group velocity dispersion (GVD), coupling coefficients and round-Trip loss, in high-Q (Q i ∼ 0.3 × 10 6 ) silicon-rich nitride MRRs. This technique allows for retrieving the GVD coefficients, intrinsic losses and coupling coefficients for each transverse mode in the resonator, thus providing very valuable feed-back information from experiments to the design flow step.

Subject headings

TEKNIK OCH TEKNOLOGIER  -- Medicinteknik -- Medicinsk laboratorie- och mätteknik (hsv//swe)
ENGINEERING AND TECHNOLOGY  -- Medical Engineering -- Medical Laboratory and Measurements Technologies (hsv//eng)
NATURVETENSKAP  -- Fysik -- Annan fysik (hsv//swe)
NATURAL SCIENCES  -- Physical Sciences -- Other Physics Topics (hsv//eng)
TEKNIK OCH TEKNOLOGIER  -- Elektroteknik och elektronik -- Annan elektroteknik och elektronik (hsv//swe)
ENGINEERING AND TECHNOLOGY  -- Electrical Engineering, Electronic Engineering, Information Engineering -- Other Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)

Keyword

Integrated photonics
Time domain response
OFDR
Optical metrology
Interferometry
Group velocity dispersion
Frequency comb
High-Q microring resonator

Publication and Content Type

kon (subject category)
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