Magnetic Scanning Probe Calibration Using Graphene Hall Sensor

• Magnetic force microscopy (MFM) offers a unique insight into the nanoscopic scale domain structures of magnetic materials. However, MFM is generally regarded as a qualitative technique and, therefore, requires meticulous calibration of the magnetic scanning probe stray field (B-probe) for quantitative measurements. We present a straightforward calibration of B-probe using scanning gate microscopy on epitaxial graphene Hall sensor in conjunction with Kelvin probe force microscopy feedback loop to eliminate sample-probe parasitic electric field interactions. Using this technique, we determined B-probe similar to 70 mT and similar to 76 mT for probes with nominal magnetic moment similar to 1 x 10(-13) and > 3 x 10(-13) emu, respectively, at a probe-sample distance of 20 nm.

Ämnesord

TEKNIK OCH TEKNOLOGIER  -- Materialteknik (hsv//swe)

ENGINEERING AND TECHNOLOGY  -- Materials Engineering (hsv//eng)

TEKNIK OCH TEKNOLOGIER  -- Annan teknik (hsv//swe)

ENGINEERING AND TECHNOLOGY  -- Other Engineering and Technologies (hsv//eng)

Nyckelord

Hall sensor

Epitaxial graphene

Kelvin probe force microscopy (KPFM)

magnetic probe calibration

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art (ämneskategori)

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