Search: id:"swepub:oai:research.chalmers.se:870e8063-d100-4511-9c61-b00b85c671e5" >
Experimental Invest...
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Zeng, Xuezhi,1980Chalmers tekniska högskola,Chalmers University of Technology
(author)
Experimental Investigation of the Accuracy of an Ultrawideband Time-Domain Microwave-Tomographic System
- Article/chapterEnglish2011
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2011
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electronicrdacarrier
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LIBRIS-ID:oai:research.chalmers.se:870e8063-d100-4511-9c61-b00b85c671e5
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https://research.chalmers.se/publication/148117URI
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https://doi.org/10.1109/TIM.2011.2141250DOI
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Language:English
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Summary in:English
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Subject category:art swepub-publicationtype
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The measurement accuracy of an ultrawideband (UWB) time-domain microwave-tomographic system is investigated. In order to make an assessment of the random variation of the measurements, the measurement repeatability of the system is evaluated by comparison with an UWB frequency-domain system. A phantom is imaged with the time-domain microwave-tomographic system, and the reconstructed images are compared with those obtained by using the frequency-domain system. The results suggest that with the averaging tens of measurements, the time-domain system can achieve the same level of measurement repeatability as that of the frequency-domain system in the interesting frequency range of microwave tomography. The imaging results, however, indicate that the phantom reconstruction does not require such high measurement accuracy. The permittivity profile of the phantom reconstructed from the nonaveraging time-domain measurements is very similar with that obtained by means of the frequency-domain system.
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Fhager, Andreas,1976Chalmers tekniska högskola,Chalmers University of Technology(Swepub:cth)elfad
(author)
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Linner, Peter,1945Chalmers tekniska högskola,Chalmers University of Technology(Swepub:cth)linner
(author)
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Persson, Mikael,1959Chalmers tekniska högskola,Chalmers University of Technology(Swepub:cth)elfmp
(author)
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Zirath, Herbert,1955Chalmers tekniska högskola,Chalmers University of Technology(Swepub:cth)zirath
(author)
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Chalmers tekniska högskola
(creator_code:org_t)
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In:IEEE Transactions on Instrumentation and Measurement60:12, s. 3939-39491557-96620018-9456
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