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Effects of differen...
Effects of different prebonding cleaning procedures on the buried oxides of bond-and-etchback silicon-on-insulator materials
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- Ericsson, Per, 1968 (författare)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Bengtsson, Stefan, 1961 (författare)
- Chalmers tekniska högskola,Chalmers University of Technology
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(creator_code:org_t)
- 1995
- 1995
- Engelska.
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Ingår i: Proceedings of the Third International Symposium on Semiconductor Wafer Bonding: Physics and Applications. ; , s. 115-
- Relaterad länk:
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https://research.cha...
Abstract
Ämnesord
Stäng
- Chemical element distributions and electrical properties of metal-oxide-semiconductor devices made of bond-and-etchback silicon-on-insulator materials were investigated. The buried oxide functioned as the gate dielectric for the metal-oxide-semiconductor devices. Three groups of devices with different bonded interface locations and prebonding cleaning procedures were made. Secondary ion mass spectroscopy revealed that bonded oxides cleaned using an RCA clean before contacting had a higher concentration of hydrogen at the bonded interface compared to devices rinsed in deionized water only. The RCA cleaned devices were also more sensitive to bias-temperature stress and charge injection by internal photoemission. Finally, partial etchback of the bonded oxides of RCA cleaned devices made the top oxide crack at several locations
Ämnesord
- TEKNIK OCH TEKNOLOGIER -- Elektroteknik och elektronik -- Annan elektroteknik och elektronik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Electrical Engineering, Electronic Engineering, Information Engineering -- Other Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)
Nyckelord
- wafer bonding
- buried layers
- thermal stresses
- secondary ion mass spectroscopy
- surface cleaning
- silicon-on-insulator
- internal stresses
- dielectric thin films
- etching
- cracks
- interface structure
- photoemission
- MOS capacitors
Publikations- och innehållstyp
- kon (ämneskategori)
- ref (ämneskategori)