Low Phase Noise GaN HEMT Oscillators With Excellent Figures of Merit

• This letter presents guidelines for the design of low phase noise oscillators in GaN high electron mobility transistor (HEMT) technology. The design starts from bias-dependent low-frequency (LF) noise measurements. Oscillator topology and bias point are then chosen for operation in regions where LF noise is low. The best LF noise properties are obtained for low drain voltage and current. Thus, the low phase noise can be achieved at low dc power which also means that power normalized phase noise figure of merit (FOM) will be good.

Subject headings

TEKNIK OCH TEKNOLOGIER  -- Elektroteknik och elektronik (hsv//swe)

ENGINEERING AND TECHNOLOGY  -- Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)

TEKNIK OCH TEKNOLOGIER  -- Elektroteknik och elektronik -- Annan elektroteknik och elektronik (hsv//swe)

ENGINEERING AND TECHNOLOGY  -- Electrical Engineering, Electronic Engineering, Information Engineering -- Other Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)

Keyword

low frequency noise

oscillator

MMIC

GaN HEMT

phase noise

negative resistance

Publication and Content Type

art (subject category)

ref (subject category)