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  • Langer, Judith (author)

Present and Future of Surface-Enhanced Raman Scattering

  • Article/chapterEnglish2020

Publisher, publication year, extent ...

  • 2019-09-03
  • American Chemical Society (ACS),2020
  • electronicrdacarrier

Numbers

  • LIBRIS-ID:oai:research.chalmers.se:b5bf6e7f-03d1-44fb-8ed5-85197aa26df6
  • https://research.chalmers.se/publication/513042URI
  • https://doi.org/10.1021/acsnano.9b04224DOI

Supplementary language notes

  • Language:English
  • Summary in:English

Part of subdatabase

Classification

  • Subject category:for swepub-publicationtype
  • Subject category:ref swepub-contenttype

Notes

  • The discovery of the enhancement of Raman scattering by molecules adsorbed on nanostructured metal surfaces is a landmark in the history of spectroscopic and analytical techniques. Significant experimental and theoretical effort has been directed toward understanding the surface-enhanced Raman scattering (SERS) effect and demonstrating its potential in various types of ultrasensitive sensing applications in a wide variety of fields. In the 45 years since its discovery, SERS has blossomed into a rich area of research and technology, but additional efforts are still needed before it can be routinely used analytically and in commercial products. In this Review, prominent authors from around the world joined together to summarize the state of the art in understanding and using SERS and to predict what can be expected in the near future in terms of research, applications, and technological development. This Review is dedicated to SERS pioneer and our coauthor, the late Prof. Richard Van Duyne, whom we lost during the preparation of this article. ©

Subject headings and genre

Added entries (persons, corporate bodies, meetings, titles ...)

  • Jimenez De Aberasturi, Dorleta (author)
  • Aizpurua, JavierDonostia International Physics Center (author)
  • Alvarez-Puebla, Ramon A.Universitat Rovira i Virgili,Rovira i Virgili University,Institucio Catalana de Recerca i Estudis Avancats (ICREA),Catalan Institution for Research and Advanced Studies (ICREA) (author)
  • Auguié, BaptisteVictoria University of Wellington (author)
  • Baumberg, Jeremy J.University Of Cambridge (author)
  • Bazan, Guillermo C.University of California (author)
  • Bell, Steven E.J.Queen's University Belfast (author)
  • Boisen, A.Danmarks Tekniske Universitet,Technical University of Denmark (author)
  • Brolo, Alexandre G.University of Victoria (author)
  • Choo, JaebumChung-Ang University (author)
  • Cialla-May, DanaFriedrich-Schiller-Universität Jena,Friedrich Schiller University Jena,Leibniz-Institut Für Photonische Technologien E.V. (author)
  • Deckert, VolkerLeibniz-Institut Für Photonische Technologien E.V.,Friedrich-Schiller-Universität Jena,Friedrich Schiller University Jena (author)
  • Fabris, LauraRutgers University (author)
  • Faulds, KarenUniversity of Strathclyde (author)
  • García de Abajo, F. J.Barcelona Institute of Science and Technology (BIST),Institucio Catalana de Recerca i Estudis Avancats (ICREA),Catalan Institution for Research and Advanced Studies (ICREA) (author)
  • Goodacre, RoystonUniversity of Liverpool (author)
  • Graham, DuncanUniversity of Strathclyde (author)
  • Haes, Amanda J.University of Iowa (author)
  • Haynes, Christy L.University of Minnesota (author)
  • Huck, ChristianRuprecht-Karls-Universität Heidelberg,Heidelberg University (author)
  • Itoh, TamitakeNational Institute of Advanced Industrial Science and Technology (AIST) (author)
  • Käll, Mikael,1963Chalmers tekniska högskola,Chalmers University of Technology(Swepub:cth)kall (author)
  • Kneipp, JaninaHumboldt-Universität zu Berlin,Humboldt University of Berlin (author)
  • Kotov, Nicholas A.University of Michigan (author)
  • Kuang, HuaJiangnan University (author)
  • Le Ru, Eric C.Victoria University of Wellington (author)
  • Lee, Hiang KweeNanyang Technological University,Stanford University (author)
  • Li, Jian Feng (author)
  • Ling, Xing YiNanyang Technological University (author)
  • Maier, S. A.Ludwig-Maximilians-Universität München,Ludwig Maximilian University of Munich (author)
  • Mayerhöfer, ThomasFriedrich-Schiller-Universität Jena,Friedrich Schiller University Jena,Leibniz-Institut Für Photonische Technologien E.V. (author)
  • Moskovits, MartinUniversity of California (author)
  • Murakoshi, KeiHokkaido University (author)
  • Nam, Jwa MinSeoul National University (author)
  • Nie, ShumingUniversity of Illinois (author)
  • Ozaki, YukihiroKwansei Gakuin University (author)
  • Pastoriza-Santos, IsabelUniversidad de Vigo,University of Vigo (author)
  • Perez-Juste, JorgeUniversidad de Vigo,University of Vigo (author)
  • Popp, JuergenLeibniz-Institut Für Photonische Technologien E.V.,Friedrich-Schiller-Universität Jena,Friedrich Schiller University Jena (author)
  • Pucci, AnnemarieRuprecht-Karls-Universität Heidelberg,Heidelberg University (author)
  • Reich, StephanieFreie Universität Berlin (author)
  • Ren, Bin (author)
  • Schatz, G.C.Northwestern University (author)
  • Shegai, Timur,1982Chalmers tekniska högskola,Chalmers University of Technology(Swepub:cth)timurs (author)
  • Schlücker, SebastianUniversität Duisburg-Essen,University of Duisburg-Essen (author)
  • Tay, Li LinNational Research Council Canada (author)
  • Thomas, K. GeorgeIndian Institute of Science (author)
  • Tian, Zhong Qun (author)
  • Van Duyne, R. P.Northwestern University (author)
  • Vo-Dinh, TuanDuke University (author)
  • Wang, YueNortheastern University China (author)
  • Willets, Katherine A.Temple University (author)
  • Xu, ChuanlaiJiangnan University (author)
  • Xu, H.Wuhan University (author)
  • Xu, YikaiQueen's University Belfast (author)
  • Yamamoto, Yuko S.Japan Advanced Institute of Science and Technology (JAIST) (author)
  • Zhao, BingJilin University (author)
  • Liz-Marzán, Luis M.Basque Foundation for Science (Ikerbasque) (author)
  • Donostia International Physics CenterUniversitat Rovira i Virgili (creator_code:org_t)

Related titles

  • In:ACS Nano: American Chemical Society (ACS)14:1, s. 28-1171936-086X1936-0851

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