Sökning: WFRF:(de Baets M)
> (2020-2024) >
Analysis of defect-...
Analysis of defect-related optical degradation of VCSILs for photonic integrated circuits
-
- Zenari, M. (författare)
- Università Degli Studi di Padova,University of Padua
-
- Buffolo, M. (författare)
- Università Degli Studi di Padova,University of Padua
-
- Fornasier, M. (författare)
- Università Degli Studi di Padova,University of Padua
-
visa fler...
-
- De Santi, C. (författare)
- Università Degli Studi di Padova,University of Padua
-
- Goyvaerts, J. (författare)
- Universiteit Gent,Ghent university
-
- Grabowski, Alexander, 1993 (författare)
- Chalmers tekniska högskola,Chalmers University of Technology
-
- Gustavsson, Johan, 1974 (författare)
- Chalmers tekniska högskola,Chalmers University of Technology
-
- Kumari, Sulakshna (författare)
- Universiteit Gent,Ghent university
-
- Stassren, A. (författare)
- Interuniversity Micro-Electronics Center at Leuven
-
- Baets, Roel G. (författare)
- Universiteit Gent,Ghent university
-
- Larsson, Anders, 1957 (författare)
- Chalmers tekniska högskola,Chalmers University of Technology
-
- Roelkens, Gunther (författare)
- Universiteit Gent,Ghent university
-
- Meneghesso, G. (författare)
- Università Degli Studi di Padova,University of Padua
-
- Zanoni, E. (författare)
- Università Degli Studi di Padova,University of Padua
-
- Meneghini, M. (författare)
- Università Degli Studi di Padova,University of Padua
-
visa färre...
-
(creator_code:org_t)
- SPIE, 2023
- 2023
- Engelska.
-
Ingår i: Proceedings of SPIE - The International Society for Optical Engineering. - : SPIE. - 0277-786X .- 1996-756X. ; 12439
- Relaterad länk:
-
https://research.cha... (primary) (free)
-
visa fler...
-
https://doi.org/10.1...
-
https://research.cha...
-
visa färre...
Abstract
Ämnesord
Stäng
- Laser diodes are of paramount importance for on-chip telecommunications applications, and a wide range of sensing devices that require near-infrared sources. In this work, the devices under test are vertical-cavity silicon-integrated lasers (VCSILs) designed for operation at 845 nm in photonic integrated circuits (PICs). We focus on the analysis of the degradation of the optical performance during aging. To investigate the reliability of the devices, we carried out several stress tests at constant current, ranging from 3.5 mA to 4.5 mA representing a highly accelerated stress condition. We observed two different degradation modes. In the first part of the experiments, the samples exhibited a worsening of the threshold current, but the sub-threshold emission was unaffected by degradation. We associated this behavior to the diffusion of impurities that, from the p-contact, were crossing the upper mirror implying a worsening of the DBR optical absorption. In the second stage of the stress test, the devices showed a higher degradation rate of the threshold current, whose variation was found to be linearly correlated to the worsening of the sub-threshold emission. We related this second degradation mode to the migration of the same impurities degrading the top DBR that, when reaching the active region of the laser, induced an increase in the non-radiative recombination rate. In addition to that, we related the two degradation modes to the change in series resistance, which was ascribed to the resistivity increment of the top DBR first and of oxide aperture afterwards.
Ämnesord
- TEKNIK OCH TEKNOLOGIER -- Elektroteknik och elektronik -- Telekommunikation (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Electrical Engineering, Electronic Engineering, Information Engineering -- Telecommunications (hsv//eng)
- NATURVETENSKAP -- Fysik -- Atom- och molekylfysik och optik (hsv//swe)
- NATURAL SCIENCES -- Physical Sciences -- Atom and Molecular Physics and Optics (hsv//eng)
Nyckelord
- VCSIL
- Degradation
- Diffusion
- PICs
Publikations- och innehållstyp
- kon (ämneskategori)
- ref (ämneskategori)
Hitta via bibliotek
Till lärosätets databas
- Av författaren/redakt...
-
Zenari, M.
-
Buffolo, M.
-
Fornasier, M.
-
De Santi, C.
-
Goyvaerts, J.
-
Grabowski, Alexa ...
-
visa fler...
-
Gustavsson, Joha ...
-
Kumari, Sulakshn ...
-
Stassren, A.
-
Baets, Roel G.
-
Larsson, Anders, ...
-
Roelkens, Gunthe ...
-
Meneghesso, G.
-
Zanoni, E.
-
Meneghini, M.
-
visa färre...
- Om ämnet
-
- TEKNIK OCH TEKNOLOGIER
-
TEKNIK OCH TEKNO ...
-
och Elektroteknik oc ...
-
och Telekommunikatio ...
-
- NATURVETENSKAP
-
NATURVETENSKAP
-
och Fysik
-
och Atom och molekyl ...
- Artiklar i publikationen
-
Proceedings of S ...
- Av lärosätet
-
Chalmers tekniska högskola