Proton-Induced X-Ray Analysis of Steel Surfaces for Microprobe Purposes

• A study of the detection limits for the elements with Z = 15-92 in thick target steel surfaces using proton-induced X-ray technique has been performed. Samples were irradiated with a broad proton beam of 2 mm diameter and the X-rays were detected by a Si(Li) detector. Detection limits at levels down to the order of 10 ppm were achieved with simultaneous measurement of several elements. Mylar and chromium absorbers were introduced in front of the semiconductor detector and irradiations at two different proton energies (1.0 and 2.5 MeV) were carried out in order to elucidate their effects on detection limits. The results are valid for microbeam analysis.

Subject headings

NATURVETENSKAP  -- Fysik -- Subatomär fysik (hsv//swe)

NATURAL SCIENCES  -- Physical Sciences -- Subatomic Physics (hsv//eng)

TEKNIK OCH TEKNOLOGIER  -- Maskinteknik -- Produktionsteknik, arbetsvetenskap och ergonomi (hsv//swe)

ENGINEERING AND TECHNOLOGY  -- Mechanical Engineering -- Production Engineering, Human Work Science and Ergonomics (hsv//eng)

Keyword

steel surface analysis

PIXE

microprobe

Publication and Content Type

art (subject category)

ref (subject category)