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The Possibility of Investigating the Influence of Surface Contamination on Oxidation by Using Electron and Ion Microscopy

Liu, Fang, 1975 (author)
Chalmers tekniska högskola,Chalmers University of Technology
Josefsson, Helena, 1978 (author)
Chalmers tekniska högskola,Chalmers University of Technology
Halvarsson, Mats, 1965 (author)
Chalmers tekniska högskola,Chalmers University of Technology
 (creator_code:org_t)
2006
2006
English.
In: The 16th International Microscopy Congress (IMC16), September 3-8, 2006, Sapporo, Japan, H. Ichinose and T. Sasaki (eds).
  • Conference paper (peer-reviewed)
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TEKNIK OCH TEKNOLOGIER  -- Materialteknik -- Annan materialteknik (hsv//swe)
ENGINEERING AND TECHNOLOGY  -- Materials Engineering -- Other Materials Engineering (hsv//eng)

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