WFRF:(Sanz Velasco Anke 1971)
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Method for measuring fracture toughness of wafer-bonded interfaces with high spatial resolution
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- Bring, Martin, 1977 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Enoksson, Peter, 1957 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Sanz-Velasco, Anke, 1971 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
- (creator_code:org_t)
- ISBN 9163192802
- 2006
- 2006
- English.
- In: proceeding of Eurosensors XX. - 9163192802
- Conference paper (peer-reviewed)
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- TEKNIK OCH TEKNOLOGIER -- Elektroteknik och elektronik -- Annan elektroteknik och elektronik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Electrical Engineering, Electronic Engineering, Information Engineering -- Other Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)
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- ref (subject category)
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