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  • Avolio, G.Katholieke Universiteit Leuven (author)

Small-Versus Large-Signal Extraction of Charge Models of Microwave FETs

  • Article/chapterEnglish2014

Publisher, publication year, extent ...

  • Institute of Electrical and Electronics Engineers (IEEE),2014

Numbers

  • LIBRIS-ID:oai:research.chalmers.se:f63830dc-3cf3-4501-9889-0a3ebb00549e
  • https://doi.org/10.1109/lmwc.2014.2313478DOI
  • https://research.chalmers.se/publication/200278URI

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  • Language:English
  • Summary in:English

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  • Subject category:art swepub-publicationtype
  • Subject category:ref swepub-contenttype

Notes

  • In this letter we extract the parameters of the charge equations of a microwave transistor nonlinear model which is available in commercial CAD tools. In particular, the charge model parameters are extracted starting from small- and large-signal measurements. A better accuracy can be achieved when using large-signal measurements since the model parameters are obtained from experimental data which better reproduce the actual operating condition of the device under test. An advanced 0.15 x 300 mu m(2) pHEMT in GaAs technology, aimed at cold-FET mixer design, is considered as case study.

Subject headings and genre

Added entries (persons, corporate bodies, meetings, titles ...)

  • Raffo, A.University of Ferrara (author)
  • Angelov, Iltcho,1943Chalmers tekniska högskola,Chalmers University of Technology(Swepub:cth)iltcho (author)
  • Crupi, G.Universita degli Studi di Messina,University of Messina (author)
  • Caddemi, A.Universita degli Studi di Messina,University of Messina (author)
  • Vannini, G.Universita degli Studi di Messina,University of Messina (author)
  • Schreurs, DmmpKatholieke Universiteit Leuven (author)
  • Katholieke Universiteit LeuvenUniversity of Ferrara (creator_code:org_t)

Related titles

  • In:IEEE Microwave and Wireless Components Letters: Institute of Electrical and Electronics Engineers (IEEE)24:6, s. 394-3961558-17641531-1309

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