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- Avolio, G.Katholieke Universiteit Leuven (author)
Identification technique of FET model based on vector nonlinear measurements
- Article/chapterEnglish2011
Publisher, publication year, extent ...
- Institution of Engineering and Technology (IET),2011
Numbers
- LIBRIS-ID:oai:research.chalmers.se:fa5368f0-6983-4986-9644-21a3865bb417
- https://doi.org/10.1049/el.2011.2892DOI
- https://research.chalmers.se/publication/150832URI
Supplementary language notes
- Language:English
- Summary in:English
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Notes
- A new modelling approach which exploits only vector nonlinear measurements is described. The parameters of the I-V and Q-V nonlinear constitutive functions are identified by combining low-and high-frequency large-signal measurements with a numerical optimisation routine. Low-frequency dispersion manifesting in the I-V characteristics is also correctly accounted for. As a case study a gallium nitride HEMT on silicon carbide substrate is considered and very good agreement between measurements and simulation is achieved.
Subject headings and genre
- TEKNIK OCH TEKNOLOGIER Elektroteknik och elektronik hsv//swe
- ENGINEERING AND TECHNOLOGY Electrical Engineering, Electronic Engineering, Information Engineering hsv//eng
- large-signal measurements
- extraction
Added entries (persons, corporate bodies, meetings, titles ...)
- Schreurs, D.Katholieke Universiteit Leuven (author)
- Raffo, A.University of Ferrara (author)
- Crupi, G.Universita degli Studi di Messina,University of Messina (author)
- Angelov, Iltcho,1943Chalmers tekniska högskola,Chalmers University of Technology(Swepub:cth)iltcho (author)
- Vannini, G.University of Ferrara (author)
- Nauwelaers, B.Katholieke Universiteit Leuven (author)
- Katholieke Universiteit LeuvenUniversity of Ferrara (creator_code:org_t)
Related titles
- In:Electronics Letters: Institution of Engineering and Technology (IET)47:24, s. 1323-U371350-911X0013-5194
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