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Soft X-ray Microscopy and Spectroscopy at the Molecular Environmental Science Beamline at the Advanced Light Source

Bluhm, H (author)
Andersson, K (author)
Stockholms universitet,Fysikum,kemi
Araki, T (author)
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Benzerara, K (author)
Brown, G.E (author)
Dynes, J.J (author)
Ghosal, S (author)
Gilles, M.K (author)
Hansen, H.-Ch (author)
Hemminger, J.C (author)
Hitchcock, A.P (author)
Ketteler, G (author)
Kilcoyne, A.L.D (author)
Kneedler, E (author)
Lawrence, J.R (author)
Leppard, G.G (author)
Majzlam, J (author)
Mun, B.S (author)
Myneni, S.C.B (author)
Nilsson, A (author)
Stockholms universitet,Fysikum,kemi
Ogasawara, H (author)
Ogletree, D.F (author)
Pecher, K (author)
Salmeron, M (author)
Shuh, D.K (author)
Tonner, B (author)
Tyliszczak, T (author)
Warwick and T.H. Yoon, T (author)
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 (creator_code:org_t)
2006
2006
English.
In: Journal of Electron Spectroscopy and Related Phenomena. ; 150, s. 86-
  • Journal article (peer-reviewed)
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