Outage Probability Analysis of IRS-Assisted Systems Under Spatially Correlated Channels

Van Chien, Trinh (author)

Papazafeiropoulos, Anastasios K. (author)

Tu, Lam Thanh (author)

Chopra, Ribhu (author)

Chatzinotas, Symeon (author)

Ottersten, Björn, 1961- (author): SnT, University of Luxembourg, Luxembourg City, 1855, Luxembourg,Signal Processing

(creator_code:org_t)

Institute of Electrical and Electronics Engineers (IEEE), 2021
2021
English.
In: IEEE Wireless Communications Letters. - : Institute of Electrical and Electronics Engineers (IEEE). - 2162-2337 .- 2162-2345. ; 10:8, s. 1815-1819

Related links:: https://urn.kb.se/re...; show more...; https://doi.org/10.1...; show less...

Abstract Subject headings

This letter investigates the impact of spatial channel correlation on the outage probability of intelligent reflecting surface (IRS)-assisted single-input single-output (SISO) communication systems. In particular, we derive a novel closed-form expression of the outage probability for arbitrary phase shifts and correlation matrices of the indirect channels. To shed light on the impact of the spatial correlation, we further attain the closed-form expressions for two common scenarios met in the literature when the large-scale fading coefficients are expressed by the loss over a propagation distance. Numerical results validate the tightness and effectiveness of the closed-form expressions. Furthermore, the spatial correlation offers significant decreases in the outage probability as the direct channel is blocked.

By the author/editor: Van Chien, Trinh; Papazafeiropoulo ...; Tu, Lam Thanh; Chopra, Ribhu; Chatzinotas, Sym ...; Ottersten, Björn ...

About the subject

ENGINEERING AND TECHNOLOGY: ENGINEERING AND ...; and Electrical Engin ...; and Signal Processin ...

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