Atomic structure of a thin silica film on a Mo(112) substrate: A combined experimental and theoretical study (vol 73, pg 165414, 2006)

Atomic structure of a thin silica film on a Mo(112) substrate : A combined experimental and theoretical study (vol 73, pg 165414, 2006)

Todorova, T. K. (author)

Sierka, M. (author)

Sauer, J. (author)

Kaya, S. (author)

Lu, J. -L. (author)

Gao, H. -J. (author)

Shaikhutdinov, S. (author)

Freund, H. -J. (author)

(creator_code:org_t)

2006
2006
English.
In: Physical Review B. Condensed Matter and Materials Physics. - 1098-0121 .- 1550-235X. ; 73:16

Related links:: https://urn.kb.se/re...; show more...; https://doi.org/10.1...; show less...

Abstract Subject headings

The atomic structure of the thin SiO2 film on a Mo(112) substrate has been determined based on a combination of density functional theory calculations and high-quality experimental data obtained from scanning tunneling microscopy, infrared reflection absorption spectroscopy, and x-ray photoelectron spectroscopy. The film consists of a honeycomblike, two-dimensional network of corner-sharing [SiO4] tetrahedra. One oxygen atom of each tetrahedron binds to the Mo(112) substrate and is located in a bridge position between Mo atoms located in rows protruding from the metal surface. The other three oxygen atoms form Si-O-Si bonds with the neighboring tetrahedra.

By the author/editor: Todorova, T. K.; Sierka, M.; Sauer, J.; Kaya, S.; Weissenrieder, J ...; Lu, J. -L.; show more...; Gao, H. -J.; Shaikhutdinov, S ...; Freund, H. -J.; show less...

About the subject

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