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Linewidth Enhancement Factor of Semiconductor Lasers : Results from Round-Robin Measurements in COST 288

Villafranca, A. (author)
Lasobras, J. (author)
Garces, I. (author)
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Giuliani, G. (author)
Donati, S. (author)
Chacinski, Marek, 1977- (author)
KTH,Mikroelektronik och Informationsteknik, IMIT,Laboratory of Photonics and Microwave Engineering
Schatz, Richard, 1963- (author)
KTH,Mikroelektronik och Informationsteknik, IMIT,Laboratory of Photonics and Microwave Engineering
Kouloumentas, C. (author)
Klonidis, D. (author)
Tomkos, I. (author)
Landais, P. (author)
Escorihuela, R. (author)
Rorison, J. (author)
Pozo, J. (author)
Fiore, A. (author)
Moreno, P. (author)
Rossetti, M. (author)
Elsasser, W. (author)
Von Staden, J. (author)
Huyet, G. (author)
Saarinen, M. (author)
Pessa, M. (author)
Leinonen, P. (author)
Vilokkinen, V. (author)
Sciamanna, M. (author)
Danckaert, J. (author)
Panajotov, K. (author)
Fordell, T. (author)
Lindberg, A. (author)
Hayau, J. -F (author)
Poette, J. (author)
Besnard, P. (author)
Grillot, F. (author)
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 (creator_code:org_t)
2007
2007
English.
In: 2007 CONFERENCE ON LASERS & ELECTRO-OPTICS/QUANTUM ELECTRONICS AND LASER SCIENCE CONFERENCE (CLEO/QELS 2007), VOLS 1-5.
  • Conference paper (peer-reviewed)
Abstract Subject headings
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  • Round-robin measurements on the linewidth enhancement factor are carried out within several laboratories participating to EU COST 288 action. The alpha-factor is measured by applying up to 7 different techniques. The obtained results are compared.

Subject headings

TEKNIK OCH TEKNOLOGIER  -- Elektroteknik och elektronik -- Telekommunikation (hsv//swe)
ENGINEERING AND TECHNOLOGY  -- Electrical Engineering, Electronic Engineering, Information Engineering -- Telecommunications (hsv//eng)
NATURVETENSKAP  -- Fysik -- Atom- och molekylfysik och optik (hsv//swe)
NATURAL SCIENCES  -- Physical Sciences -- Atom and Molecular Physics and Optics (hsv//eng)

Keyword

COST 288;linewidth enhancement factor;round-robin measurements;semiconductor lasers;semiconductor lasers

Publication and Content Type

ref (subject category)
kon (subject category)

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