Search: id:"swepub:oai:DiVA.org:liu-109934" >
Single crystal sili...
Single crystal silicon carbide detector of emitted ions and soft x rays from power laser-generated plasmas
-
- Torrisi, Lorenzo (author)
- University of Messina, Italy
-
- Foti, Gaetano (author)
- University of Catania, Italy
-
- Giuffrida, Lorenzo (author)
- University of Messina, Italy
-
show more...
-
- Puglisi, Donatella (author)
- University of Catania, Italy
-
- Wolowski, J. (author)
- Institute of Plasma Physics and Laser Microfusion, Warsaw, Poland
-
- Badziak, J. (author)
- Institute of Plasma Physics and Laser Microfusion, Warsaw, Poland
-
- Parys, P. (author)
- Institute of Plasma Physics and Laser Microfusion, Warsaw, Poland
-
- Rosinski, M. (author)
- Institute of Plasma Physics and Laser Microfusion, Warsaw, Poland
-
- Margarone, Daniele (author)
- Institute of Physics, ASCR, Prague, Czech Republic
-
- Krasa, J. (author)
- Institute of Physics, ASCR, Prague, Czech Republic
-
- Velyhan, A. (author)
- Institute of Physics, ASCR, Prague, Czech Republic
-
- Ullschmied, U. (author)
- Institute of Physics, ASCR, Prague, Czech Republic
-
show less...
-
(creator_code:org_t)
- American Institute of Physics (AIP), 2009
- 2009
- English.
-
In: Journal of Applied Physics. - : American Institute of Physics (AIP). - 0021-8979 .- 1089-7550. ; 105, s. 123304-1-123304-7
- Related links:
-
https://urn.kb.se/re...
-
show more...
-
https://doi.org/10.1...
-
show less...
Abstract
Subject headings
Close
- A single-crystal silicon carbide SiC detector was used for measurements of soft x rays, electrons, and ion emission from laser-generated plasma obtained with the use of the Prague Asterix Laser System PALS at intensities of the order of 1016 W/cm2 and pulse duration of 300 ps. Measurements were performed by varying the laser intensity and the nature of the irradiated target. The spectra obtained by using the SiC detector show not only the photopeak due to UV and softx-ray detection, but also various peaks due to the detection of energetic charged particles. Time-of-flight technique was employed to determine the ion kinetic energy of particles emitted from the plasma and to perform a comparison between SiC and traditional ion collectors. The detector was also employed by inserting absorber films of different thickness in front of the SiC surface inorder to determine, as a first approximation, the mean energy of the soft x-ray emission from the plasma.
Subject headings
- NATURVETENSKAP -- Fysik (hsv//swe)
- NATURAL SCIENCES -- Physical Sciences (hsv//eng)
Keyword
- Silicon carbide
- x-ray detector
- laser
- plasma
- time of flight
Publication and Content Type
- ref (subject category)
- art (subject category)
Find in a library
To the university's database
- By the author/editor
-
Torrisi, Lorenzo
-
Foti, Gaetano
-
Giuffrida, Loren ...
-
Puglisi, Donatel ...
-
Wolowski, J.
-
Badziak, J.
-
show more...
-
Parys, P.
-
Rosinski, M.
-
Margarone, Danie ...
-
Krasa, J.
-
Velyhan, A.
-
Ullschmied, U.
-
show less...
- About the subject
-
- NATURAL SCIENCES
-
NATURAL SCIENCES
-
and Physical Science ...
- Articles in the publication
-
Journal of Appli ...
- By the university
-
Linköping University