Sökning: id:"swepub:oai:DiVA.org:liu-24699" > Test Scheduling for...
Fältnamn | Indikatorer | Metadata |
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000 | 02790naa a2200385 4500 | |
001 | oai:DiVA.org:liu-24699 | |
003 | SwePub | |
008 | 091007s2005 | |||||||||||000 ||eng| | |
024 | 7 | a https://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-246992 URI |
040 | a (SwePub)liu | |
041 | a engb eng | |
042 | 9 SwePub | |
072 | 7 | a ref2 swepub-contenttype |
072 | 7 | a kon2 swepub-publicationtype |
100 | 1 | a Ingelsson, Urbanu IDA Linköpings Universitet4 aut |
245 | 1 0 | a Test Scheduling for Modular SOCs in an Abort-on-Fail Environment |
264 | 1 | a Tallinn, Estonia :b IEEE Computer Society Press,c 2005 |
338 | a print2 rdacarrier | |
520 | a Complex SOCs are increasingly tested in a modular fashion, which enables us to record the yield-per-module. In this paper, we consider the yield-per-module as the pass probability of the module s manufacturing test. We use it to exploit the abort-on-fail feature of ATEs, in order to reduce the expected test application time. We present a model for expected test application time, which obtains increasing accuracy due to decreasing granularity of the abortable test unit. For a given SOC, with a modular test architecture consisting of wrappers and disjunct TAMs, and for given pass probabilities per module test, we schedule the tests on each TAM such that the expected test application time is minimized. We describe two heuristic scheduling approaches, one without and one with preemption. Experimental results for the ITC 02 SOC Test Benchmarks demonstrate the effectiveness of our approach, as we achieve up to 97% reduction in the expected test application time, without any modification to the SOC or ATE. | |
650 | 7 | a NATURVETENSKAPx Data- och informationsvetenskapx Datavetenskap0 (SwePub)102012 hsv//swe |
650 | 7 | a NATURAL SCIENCESx Computer and Information Sciencesx Computer Sciences0 (SwePub)102012 hsv//eng |
653 | a testing | |
653 | a systems-on-chip | |
653 | a yield-per-module | |
653 | a TAM | |
653 | a test scheduling | |
653 | a Computer science | |
653 | a Datavetenskap | |
700 | 1 | a Goel, Sandeep Kumaru IC Design Digital Design and Test Philips Research Labs4 aut |
700 | 1 | a Larsson, Erik,d 1966-u Linköpings universitet,Tekniska högskolan,ESLAB - Laboratoriet för inbyggda system4 aut0 (Swepub:liu)erila46 |
700 | 1 | a Marinissen, Erik Janu IC Design Digital Design and Test Philips Research Labs4 aut |
710 | 2 | a IDA Linköpings Universitetb IC Design Digital Design and Test Philips Research Labs4 org |
773 | 0 | t IEEE European Test Symposium ETS 05,2005d Tallinn, Estonia : IEEE Computer Society Press |
856 | 4 | u http://www.ida.liu.se/labs/eslab/publications/pap/db/ets05_erila.pdf |
856 | 4 8 | u https://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-24699 |
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