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Excellence in variant testing
-
- Schlingloff, H. (author)
- Fraunhofer, Germany
-
- Kruse, P. M. (author)
- Expleo Germany GmbH, Germany
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- Saadatmand, Mehrdad, 1980- (author)
- RISE,SICS
- (creator_code:org_t)
- 2020-02-06
- 2020
- English.
- In: ACM International Conference Proceeding Series. - New York, NY, USA : Association for Computing Machinery. - 9781450375016
- Conference paper (peer-reviewed)
Abstract
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- In this short paper, we report on the motivation, background and ambition of the ITEA3 project XIVT - excellence in variant testing. We describe a work flow and tool chain for testing of configurable and highly-variant embedded systems in various domains. © 2020 Copyright is held by the owner/author(s).
Keyword
- Computer applications
- Computer programming
- Work-flows
- Embedded systems
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- ref (subject category)
- kon (subject category)
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