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Extraction of thermal time constant in HBTs using small signal measurements

Bruce, S (author)
Uppsala universitet,Institutionen för materialvetenskap,SIGNALS AND SYSTEMS
Trasser, A (author)
Birk, M (author)
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Rydberg, A (author)
Schumacher, H (author)
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 (creator_code:org_t)
IEE-INST ELEC ENG, 1997
1997
English.
In: ELECTRONICS LETTERS. - : IEE-INST ELEC ENG. - 0013-5194. ; 33:2, s. 165-167
  • Journal article (peer-reviewed)
Abstract Subject headings
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  • A novel method for finding the thermal time constant of HBTs is proposed. It utilises small signal measurements in the frequency domain of the typical negative differential resistance found int he active region, i.e. normal bias conditions for the device.

Subject headings

TEKNIK OCH TEKNOLOGIER  -- Elektroteknik och elektronik -- Signalbehandling (hsv//swe)
ENGINEERING AND TECHNOLOGY  -- Electrical Engineering, Electronic Engineering, Information Engineering -- Signal Processing (hsv//eng)

Keyword

heterojunction bipolar transistors; semiconductor device characterisation
Signal processing
Signalbehandling

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Bruce, S
Trasser, A
Birk, M
Rydberg, A
Schumacher, H
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ENGINEERING AND TECHNOLOGY
ENGINEERING AND ...
and Electrical Engin ...
and Signal Processin ...
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ELECTRONICS LETT ...
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Uppsala University

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