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Extraction of therm...
Extraction of thermal time constant in HBTs using small signal measurements
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- Bruce, S (author)
- Uppsala universitet,Institutionen för materialvetenskap,SIGNALS AND SYSTEMS
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Trasser, A (author)
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Birk, M (author)
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Rydberg, A (author)
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Schumacher, H (author)
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(creator_code:org_t)
- IEE-INST ELEC ENG, 1997
- 1997
- English.
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In: ELECTRONICS LETTERS. - : IEE-INST ELEC ENG. - 0013-5194. ; 33:2, s. 165-167
- Related links:
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https://urn.kb.se/re...
Abstract
Subject headings
Close
- A novel method for finding the thermal time constant of HBTs is proposed. It utilises small signal measurements in the frequency domain of the typical negative differential resistance found int he active region, i.e. normal bias conditions for the device.
Subject headings
- TEKNIK OCH TEKNOLOGIER -- Elektroteknik och elektronik -- Signalbehandling (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Electrical Engineering, Electronic Engineering, Information Engineering -- Signal Processing (hsv//eng)
Keyword
- heterojunction bipolar transistors; semiconductor device characterisation
- Signal processing
- Signalbehandling
Publication and Content Type
- ref (subject category)
- art (subject category)
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