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GHz sample excitati...
GHz sample excitation at the ALBA-PEEM
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- Khaliq, Muhammad Waqas (author)
- ALBA Synchrotron Light Facility,University of Barcelona
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- Álvarez, José M. (author)
- ALBA Synchrotron Light Facility
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- Camps, Antonio (author)
- ALBA Synchrotron Light Facility
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- González, Nahikari (author)
- ALBA Synchrotron Light Facility
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- Ferrer, José (author)
- ALBA Synchrotron Light Facility
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- Martinez-Carboneres, Ana (author)
- Lund University,Lunds universitet,MAX IV, Vakuum,MAX IV, Teknik I,MAX IV, Tekniska divisionen,MAX IV-laboratoriet,MAX IV, Vacuum,MAX IV, Engineering I,MAX IV, Technical division,MAX IV Laboratory
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- Prat, Jordi (author)
- ALBA Synchrotron Light Facility
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- Ruiz-Gómez, Sandra (author)
- Max Planck Institute for Chemical Physics of Solids
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- Niño, Miguel Angel (author)
- ALBA Synchrotron Light Facility
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- Macià, Ferran (author)
- University of Barcelona
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- Aballe, Lucia (author)
- ALBA Synchrotron Light Facility
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- Foerster, Michael (author)
- ALBA Synchrotron Light Facility
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(creator_code:org_t)
- 2023
- 2023
- English.
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In: Ultramicroscopy. - 0304-3991. ; 250
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Abstract
Subject headings
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- We describe a setup that is used for high-frequency electrical sample excitation in a cathode lens electron microscope with the sample stage at high voltage as used in many synchrotron light sources. Electrical signals are transmitted by dedicated high-frequency components to the printed circuit board supporting the sample. Sub-miniature push-on connectors (SMP) are used to realize the connection in the ultra-high vacuum chamber, bypassing the standard feedthrough. A bandwidth up to 4 GHz with -6 dB attenuation was measured at the sample position, which allows to apply sub-nanosecond pulses. We describe different electronic sample excitation schemes and demonstrate a spatial resolution of 56 nm employing the new setup.
Subject headings
- TEKNIK OCH TEKNOLOGIER -- Elektroteknik och elektronik -- Annan elektroteknik och elektronik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Electrical Engineering, Electronic Engineering, Information Engineering -- Other Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)
Keyword
- Cathode lens microscopy
- Electronic modules
- High frequency electrical excitations
- LEEM-PEEM
- Sample environment
Publication and Content Type
- art (subject category)
- ref (subject category)
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- By the author/editor
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Khaliq, Muhammad ...
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Álvarez, José M.
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Camps, Antonio
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González, Nahika ...
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Ferrer, José
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Martinez-Carbone ...
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show more...
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Prat, Jordi
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Ruiz-Gómez, Sand ...
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Niño, Miguel Ang ...
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Macià, Ferran
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Aballe, Lucia
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Foerster, Michae ...
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- About the subject
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- ENGINEERING AND TECHNOLOGY
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ENGINEERING AND ...
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and Electrical Engin ...
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and Other Electrical ...
- Articles in the publication
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Ultramicroscopy
- By the university
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Lund University