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GHz sample excitation at the ALBA-PEEM

Khaliq, Muhammad Waqas (author)
ALBA Synchrotron Light Facility,University of Barcelona
Álvarez, José M. (author)
ALBA Synchrotron Light Facility
Camps, Antonio (author)
ALBA Synchrotron Light Facility
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González, Nahikari (author)
ALBA Synchrotron Light Facility
Ferrer, José (author)
ALBA Synchrotron Light Facility
Martinez-Carboneres, Ana (author)
Lund University,Lunds universitet,MAX IV, Vakuum,MAX IV, Teknik I,MAX IV, Tekniska divisionen,MAX IV-laboratoriet,MAX IV, Vacuum,MAX IV, Engineering I,MAX IV, Technical division,MAX IV Laboratory
Prat, Jordi (author)
ALBA Synchrotron Light Facility
Ruiz-Gómez, Sandra (author)
Max Planck Institute for Chemical Physics of Solids
Niño, Miguel Angel (author)
ALBA Synchrotron Light Facility
Macià, Ferran (author)
University of Barcelona
Aballe, Lucia (author)
ALBA Synchrotron Light Facility
Foerster, Michael (author)
ALBA Synchrotron Light Facility
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 (creator_code:org_t)
2023
2023
English.
In: Ultramicroscopy. - 0304-3991. ; 250
  • Journal article (peer-reviewed)
Abstract Subject headings
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  • We describe a setup that is used for high-frequency electrical sample excitation in a cathode lens electron microscope with the sample stage at high voltage as used in many synchrotron light sources. Electrical signals are transmitted by dedicated high-frequency components to the printed circuit board supporting the sample. Sub-miniature push-on connectors (SMP) are used to realize the connection in the ultra-high vacuum chamber, bypassing the standard feedthrough. A bandwidth up to 4 GHz with -6 dB attenuation was measured at the sample position, which allows to apply sub-nanosecond pulses. We describe different electronic sample excitation schemes and demonstrate a spatial resolution of 56 nm employing the new setup.

Subject headings

TEKNIK OCH TEKNOLOGIER  -- Elektroteknik och elektronik -- Annan elektroteknik och elektronik (hsv//swe)
ENGINEERING AND TECHNOLOGY  -- Electrical Engineering, Electronic Engineering, Information Engineering -- Other Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)

Keyword

Cathode lens microscopy
Electronic modules
High frequency electrical excitations
LEEM-PEEM
Sample environment

Publication and Content Type

art (subject category)
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