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Noise and Aliasing Aspects in a Multiharmonic-Dielectric-Response-Measurement System
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- Sonerud, Björn, 1979 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Bengtsson, Tord, 1954 (author)
- ABB
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- Blennow, Jörgen, 1966 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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- 2011
- 2011
- English.
- In: IEEE Transactions on Instrumentation and Measurement. - 1557-9662 .- 0018-9456. ; 60:13, s. 3875-3882
- Conference paper (peer-reviewed)
Abstract
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- Dielectric-response measurements are commonly performed with frequency-domain spectroscopy, polarization/depolarization-current measurements, or return-voltage measurements. These techniques operate in a frequency or time domain, and all have high requirements on the voltage source in order to acquire accurate results. This limits dielectric-response measurements to offline applications. A new technique, which is called arbitrary-waveform- impedance spectroscopy, has been developed, which makes use of the harmonics of any voltage waveform to perform dielectric-response measurements. The technique provides possibilities for online measurements facilitating the monitoring of materials and components in high-voltage applications. Here, the different aspects of the measurement system are presented, including circuit modeling, normalization, and discussions on aliasing and noise; all of them are necessary to control in order to perform accurate measurements. © 2011 IEEE.
Subject headings
- TEKNIK OCH TEKNOLOGIER -- Elektroteknik och elektronik -- Reglerteknik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Electrical Engineering, Electronic Engineering, Information Engineering -- Control Engineering (hsv//eng)
- TEKNIK OCH TEKNOLOGIER -- Elektroteknik och elektronik -- Annan elektroteknik och elektronik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Electrical Engineering, Electronic Engineering, Information Engineering -- Other Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)
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