Intermetallic Compound Formation in Sn-Co-Cu, Sn-Ag-Cu and Eutectic Sn-Cu Solder Joints on Electroless Ni(P) Immersion Au Surface Finish After Reflow Soldering

Sun, Peng, 1979 (author): Chalmers tekniska högskola,Chalmers University of Technology

Andersson, Cristina, 1969 (author): Chalmers tekniska högskola,Chalmers University of Technology

Cheng, Zhaonian, 1942 (author): Chalmers tekniska högskola,Chalmers University of Technology

Shangguan, Dongkai (author)

Liu, Johan, 1960 (author): Chalmers tekniska högskola,Chalmers University of Technology

(creator_code:org_t)

Elsevier BV, 2006
2006
English.
In: Materials Science & Engineering B: Solid-State Materials for Advanced Technology. - : Elsevier BV. - 0921-5107. ; 135:2, s. 134-140

Related links:: http://dx.doi.org/10...; show more...; https://doi.org/10.1...; https://research.cha...; show less...

Abstract Subject headings

The interfacial reactions between Sn-0.4Co-0.7Cu eutectic alloy and immersion Au/electroless Ni(P)/Cu substrate were investigated after reflow soldering at 260 °C for 2 min. Common Sn-4.0Ag-0.5Cu and eutectic Sn-0.7Cu solders were used as reference. Two types of intermetallic compounds (IMC) were found in the solder matrix of the Sn-0.4Co-0.7Cu alloy, namely coarser CoSn 2 and finer Cu 6 Sn 5 particles, while only one ternary (Cu, Ni) 6 Sn 5 interfacial compound was detected between the solder alloy and the electroless nickel and immersion gold (ENIG) coated substrate. The same trend was also observed for the Sn-Ag-Cu and Sn-Cu solder joints. Compared with the CoSn 2 particles found in the Sn-Co-Cu solder and the Ag 3 Sn particles found in the Sn-Ag-Cu solder, the Cu 6 Sn 5 particles found in both solder systems exhibited finer structure and more uniform distribution. It was noted that the thickness of the interfacial IMCs for the Sn-Co-Cu, Sn-Ag-Cu and Sn-Cu alloys was 3.5 μm, 4.3 μm and 4.1 μm, respectively, as a result of longer reflow time above the alloy's melting temperature since the Sn-Ag-Cu solder alloy has the lowest melting point. © 2006 Elsevier B.V. All rights reserved.

By the author/editor: Sun, Peng, 1979; Andersson, Crist ...; Wei, Xicheng; Cheng, Zhaonian, ...; Shangguan, Dongk ...; Liu, Johan, 1960

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