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The nature of self-...
The nature of self-assembled octadecylphosphonic acid (ODPA) layers on copper substrates
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- Zhao, Weijie (author)
- KTH,Yt- och korrosionsvetenskap,KTH Royal Inst Technol, Dept Chem, Div Surface & Corros Sci, SE-10044 Stockholm, Sweden.
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- Göthelid, Mats (author)
- KTH,Material- och nanofysik,KTH Royal Inst Technol, Dept Appl Phys Mat & Nano Phys, SE-16440 Stockholm, Sweden.
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- Hosseinpour, Saman (author)
- Institute of Particle Technology (LFG), Friedrich-Alexander-Universität-Erlangen-Nürnberg (FAU), 91058 Erlangen, Germany,Friedrich Alexander Univ Erlangen Nurnberg FAU, Inst Particle Technol LFG, D-91058 Erlangen, Germany.
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- Johansson, Malin B, 1972- (author)
- Uppsala universitet,Fysikalisk kemi
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- Li, Gen (author)
- KTH,Yt- och korrosionsvetenskap,KTH Royal Inst Technol, Dept Chem, Div Surface & Corros Sci, SE-10044 Stockholm, Sweden.
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- Leygraf, Christopher, 1946- (author)
- KTH,Yt- och korrosionsvetenskap,KTH Royal Inst Technol, Dept Chem, Div Surface & Corros Sci, SE-10044 Stockholm, Sweden.
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- Johnson, C. Magnus (author)
- KTH,Yt- och korrosionsvetenskap,KTH Royal Inst Technol, Dept Chem, Div Surface & Corros Sci, SE-10044 Stockholm, Sweden.
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(creator_code:org_t)
- Academic Press Inc. 2021
- 2021
- English.
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In: Journal of Colloid and Interface Science. - : Academic Press Inc.. - 0021-9797 .- 1095-7103. ; 581, s. 816-825
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https://urn.kb.se/re...
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https://doi.org/10.1...
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Abstract
Subject headings
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- Hypothesis: The self-assembly of amphiphilic molecules onto solid substrates can result both in the formation of monolayers and multilayers. However, on oxidized and non-oxidized copper (Cu), only monolayer formation was reported for phosphonic acids possessing one phosphate head group. Here, the adsorption of octadecylphosphonic acid (ODPA) on Cu substrates through a self-assembly process was investigated with the initial hypothesis of monolayer formation. Experiments: The relative amount of ODPA adsorbed on a Cu substrate was determined by infrared reflection/absorption spectroscopy (IRRAS) and by atomic force microscopy (AFM) investigations before and after ODPA deposition. X-ray photoelectron spectroscopy (XPS) with sputtering was used to characterize the nature of the layers. Findings: The results show that the thickness of the ODPA layer increased with deposition time, and after 1 h a multilayer film with a thickness of some tens of nm was formed. The film was robust and required long-time sonication for removal. The origin of the film robustness was attributed to the release of Cu ions, resulting in the formation of Cu-ODPA complexes with Cu ions in the form of Cu(I). Preadsorbing a monolayer of octadecylthiol (ODT) onto the Cu resulted in no ODPA adsorption, since the release of Cu(I) ions was abolished.
Subject headings
- NATURVETENSKAP -- Fysik -- Den kondenserade materiens fysik (hsv//swe)
- NATURAL SCIENCES -- Physical Sciences -- Condensed Matter Physics (hsv//eng)
- NATURVETENSKAP -- Kemi -- Materialkemi (hsv//swe)
- NATURAL SCIENCES -- Chemical Sciences -- Materials Chemistry (hsv//eng)
- NATURVETENSKAP -- Kemi -- Fysikalisk kemi (hsv//swe)
- NATURAL SCIENCES -- Chemical Sciences -- Physical Chemistry (hsv//eng)
Keyword
- Atomic force microscopy
- Copper leaching
- Infrared reflection/absorption spectroscopy
- Octadecylphosphonic acid
- Self-assembled monolayers
- X-ray photoelectron spectroscopy
- Copper metallography
- Deposition
- Heavy ions
- Monolayers
- Multilayer films
- Multilayers
- Substrates
- X ray photoelectron spectroscopy
- Amphiphilic molecules
- Copper substrates
- Infrared reflections
- Initial hypothesis
- Monolayer formation
- Octadecylphosphonic acids
- Phosphonic acids
- Self assembly process
- Copper compounds
- copper ion
- octadecylthiol
- phosphonic acid derivative
- self assembled monolayer
- thiol derivative
- unclassified drug
- absorption spectroscopy
- acid deposition
- adsorption
- analytic method
- Article
- chemical analysis
- chemical structure
- cheminformatics
- complex formation
- controlled study
- film thickness
- infrared spectroscopy
- priority journal
- reflectometry
- ultrasound
- X ray photoemission spectroscopy
Publication and Content Type
- ref (subject category)
- art (subject category)
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