In-situ electrical characterization during defect insertion in exfoliated graphene sheets with a focused gallium ion beam at room and cryogenic temperatures

Subject headings

TEKNIK OCH TEKNOLOGIER  -- Nanoteknik (hsv//swe)

ENGINEERING AND TECHNOLOGY  -- Nano-technology (hsv//eng)

TEKNIK OCH TEKNOLOGIER  -- Elektroteknik och elektronik -- Annan elektroteknik och elektronik (hsv//swe)

ENGINEERING AND TECHNOLOGY  -- Electrical Engineering, Electronic Engineering, Information Engineering -- Other Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)

Keyword

Focused Ion beam

Graphene

defects

conductivity

cryogenic temperatures

Teknisk fysik med inriktning mot materialanalys

Engineering Science with specialization in Materials Analysis

Publication and Content Type

vet (subject category)

ovr (subject category)