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Implementation of the DTMROC-S ASIC for the ATLAS TRT Detector in a 0.25μm CMOS technology

Åkesson, Torsten (author)
Lund University,Lunds universitet,Partikel- och kärnfysik,Fysiska institutionen,Institutioner vid LTH,Lunds Tekniska Högskola,Particle and nuclear physics,Department of Physics,Departments at LTH,Faculty of Engineering, LTH
Anghinolfi, F (author)
Dressnandt, N (author)
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Eerola, Paula (author)
Lund University,Lunds universitet,Partikel- och kärnfysik,Fysiska institutionen,Institutioner vid LTH,Lunds Tekniska Högskola,Particle and nuclear physics,Department of Physics,Departments at LTH,Faculty of Engineering, LTH
Farthouat, Ph (author)
Keener, P T (author)
Lichard, P (author)
Newcomer, F M (author)
Ryjov, V (author)
Szczygiel, R (author)
Van Berg, R (author)
Williams, H H (author)
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 (creator_code:org_t)
2003
2003
English.
In: IEEE Nuclear Science Symposium and Medical Imaging Conference. - 1082-3654. - 0780376366 ; 1, s. 549-553
  • Conference paper (peer-reviewed)
Abstract Subject headings
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  • The DTMROC-S is a 16-channeI front-end chip developed for the signal processing of the ATLAS straw tube detector, TRT. Due to a highly radioactive environment, the chip is fabricated in a commercial 0.25μm CMOS technology hardened by layout techniques and, in addition, a special methodology was used to improve the circuit's robustness against Single Events Effects (SEE) caused by ionizing particles. Exhaustive internal test features were foreseen to simplify and ensure comprehensive design verification, high fault coverage and throughput. Compared to the previous version of the chip done in a 0.8μm radiation-hard CMOS and despite of all supplementary features, the Deep-Sub-Micron (DSM) technology results in a much smaller chip size that increases the production yield and lowers the power consumption.

Subject headings

NATURVETENSKAP  -- Fysik -- Subatomär fysik (hsv//swe)
NATURAL SCIENCES  -- Physical Sciences -- Subatomic Physics (hsv//eng)

Keyword

Single events effects (SEE)

Publication and Content Type

kon (subject category)
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