IGBT Power Stack Integrity Assessment Method for High-Power Magnet Supplies

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Fältnamn	Indikatorer	Metadata
000		04099naa a2200457 4500
001		oai:research.chalmers.se:4ee0011c-d8c6-404f-98cf-db2dfb975b73
003		SwePub
008		190918s2019 \| \|\|\|\|\|\|\|\|\|\|\|000 \|\|eng\|
024	7	a https://research.chalmers.se/publication/5124512 URI
024	7	a https://doi.org/10.1109/TPEL.2019.29003932 DOI
040		a (SwePub)cth
041		a engb eng
042		9 SwePub
072	7	a art2 swepub-publicationtype
072	7	a ref2 swepub-contenttype
100	1	a Asimakopoulos, Panagiotis,d 1985u Organisation européenne pour la recherche nucléaire (CERN),European Organization for Nuclear Research (CERN)4 aut0 (Swepub:cth)panasi
245	1 0	a IGBT Power Stack Integrity Assessment Method for High-Power Magnet Supplies
264	1	c 2019
338		a electronic2 rdacarrier
520		a This paper proposes a method for assessing the integrity of a series of insulated-gate bipolar transistor (IGBT) power stacks during factory-acceptance tests and service stops. The key challenge that is addressed in this paper is detecting common assembly issues that affect the power stack thermal path as well as distinguishing the acute aging effects of bond-wire lift-off and solder delamination. The method combines offline Vce measurements with current in the extended Zero Temperature Coefficient (ZTC) operating region as well as with sensing current without modifications to the power stack. It also employs on-the-stack Vce calibration for both the measurements. Additionally, only a fixed duty cycle pattern is needed to control the switches. The paper also presents a sensitivity analysis of the method to various parameters such as the current level in the extended ZTC operating region, the precision of the Vce measurement, as well as the ambient, the cooling-water, and the junction temperatures. The experimental results are obtained from a high-current IGBT power stack used in a magnet power supply for particle accelerators and are compared favorably to results from finite element method and lumped parameter network simulations confirming the applicability of the method.
650	7	a TEKNIK OCH TEKNOLOGIERx Maskinteknikx Energiteknik0 (SwePub)203042 hsv//swe
650	7	a ENGINEERING AND TECHNOLOGYx Mechanical Engineeringx Energy Engineering0 (SwePub)203042 hsv//eng
650	7	a NATURVETENSKAPx Fysikx Annan fysik0 (SwePub)103992 hsv//swe
650	7	a NATURAL SCIENCESx Physical Sciencesx Other Physics Topics0 (SwePub)103992 hsv//eng
650	7	a TEKNIK OCH TEKNOLOGIERx Elektroteknik och elektronikx Annan elektroteknik och elektronik0 (SwePub)202992 hsv//swe
650	7	a ENGINEERING AND TECHNOLOGYx Electrical Engineering, Electronic Engineering, Information Engineeringx Other Electrical Engineering, Electronic Engineering, Information Engineering0 (SwePub)202992 hsv//eng
653		a thermal performance
653		a Aging detection
653		a insulatedgate bipolar transistor (IGBT)
653		a particle accelerators
653		a Vce method
653		a condition monitoring
700	1	a Papastergiou, K.u Organisation européenne pour la recherche nucléaire (CERN),European Organization for Nuclear Research (CERN)4 aut
700	1	a Thiringer, Torbjörn,d 1966u Chalmers tekniska högskola,Chalmers University of Technology4 aut0 (Swepub:cth)thorbear
700	1	a Bongiorno, Massimo,d 1976u Chalmers tekniska högskola,Chalmers University of Technology4 aut0 (Swepub:cth)massimob
700	1	a Le Godec, Gillesu Organisation européenne pour la recherche nucléaire (CERN),European Organization for Nuclear Research (CERN)4 aut
710	2	a Organisation européenne pour la recherche nucléaire (CERN)b Chalmers tekniska högskola4 org
773	0	t IEEE Transactions on Power Electronicsg 34:11, s. 11228-11240q 34:11<11228-11240x 0885-8993x 1941-0107
856	4	u https://research.chalmers.se/publication/512451/file/512451_Fulltext.pdfx primaryx freey FULLTEXT
856	4 8	u https://research.chalmers.se/publication/512451
856	4 8	u https://doi.org/10.1109/TPEL.2019.2900393

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