WFRF:(Almqvist Sverker)
Sökning: WFRF:(Almqvist Sverker) > Roughness determina...
LIBRIS Formathandbok (Information om MARC21)
| Fältnamn | Indikatorer | Metadata |
|---|---|---|
| 000 | 02319naa a2200349 4500 | |
| 001 | oai:DiVA.org:ltu-13241 | |
| 003 | SwePub | |
| 008 | 160929s1995 | |||||||||||000 ||eng| | |
| 024 | 7 | a https://urn.kb.se/resolve?urn=urn:nbn:se:ltu:diva-132412 URI |
| 024 | 7 | a https://doi.org/10.1016/0040-6090(95)06933-X2 DOI |
| 040 | a (SwePub)ltu | |
| 041 | a engb eng | |
| 042 | 9 SwePub | |
| 072 | 7 | a ref2 swepub-contenttype |
| 072 | 7 | a art2 swepub-publicationtype |
| 100 | 1 | a Almqvist, Nilsu Luleå tekniska universitet,Materialvetenskap4 aut0 (Swepub:ltu)nils |
| 245 | 1 0 | a Roughness determination of plasma-modified surface layers with atomic force microscopy |
| 264 | 1 | c 1995 |
| 338 | a print2 rdacarrier | |
| 500 | a Godkänd; 1995; Bibliografisk uppgift: 22nd International Conference on Metallurgical Coatings and Thin Films; 20070409 (ysko) | |
| 520 | a Graphite surfaces exposed to the deuterium plasma in the TEXTOR tokamak were characterized in detail by means of scanning probe microscopy, ion beam analysis and colorimetry methods. The aim is to study the composition and structure of thin layer deposits formed on surfaces subjected to the tokamak plasma. The surface roughness was measured and parametrized in terms of fractal dimension and scaling constant. Several different methods for the fractal analysis of plasma-exposed surfaces have been critically evaluated. The main emphasis of this paper is on the correlation between surface roughness (fractal parameters), the amount of deposited atoms and the layer thickness. | |
| 650 | 7 | a NATURVETENSKAPx Fysikx Annan fysik0 (SwePub)103992 hsv//swe |
| 650 | 7 | a NATURAL SCIENCESx Physical Sciencesx Other Physics Topics0 (SwePub)103992 hsv//eng |
| 653 | a Fysik | |
| 653 | a Fysik | |
| 700 | 1 | a Rubel, M.u Royal Institute of Technology, Physics Department-Frescati, Association EURATOM-NFR4 aut |
| 700 | 1 | a Wienhold, P.u Institute of Plasma Physics, Forschungszentrum Jülich, Association EURATOM-KFA4 aut |
| 700 | 1 | a Fredriksson, Sverker4 aut |
| 710 | 2 | a Luleå tekniska universitetb Materialvetenskap4 org |
| 773 | 0 | t Thin Solid Filmsg 270:1-2, s. 426-430q 270:1-2<426-430x 0040-6090x 1879-2731 |
| 856 | 4 8 | u https://urn.kb.se/resolve?urn=urn:nbn:se:ltu:diva-13241 |
| 856 | 4 8 | u https://doi.org/10.1016/0040-6090(95)06933-X |
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